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浏览/检索结果: 共6条，第1-6条 帮助 限定条件 学科主题：半导体材料     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Well-width dependence of in-plane optical anisotropy in (001) GaAs/AlGaAs quantum wells induced by in-plane uniaxial strain and interface asymmetry 期刊论文 journal of applied physics, 2009, 卷号: 105, 期号: 10, 页码: art. no. 103108 作者:  Xu B;  Ye XL 收藏  |  浏览/下载：71/0  |  提交时间：2010/03/08 aluminium compounds  gallium arsenide  III-V semiconductors  internal stresses  reflectivity  semiconductor heterojunctions  semiconductor quantum wells   Effect of small-angle scattering on the integer quantum Hall plateau 期刊论文 chinese physics letters, 2006, 卷号: 23, 期号: 2, 页码: 436-438 Shu Q; Lin YW; Xing XD; Yao JH; Pi B; Shu YC; Wang ZG; Xu JJ 收藏  |  浏览/下载：267/7  |  提交时间：2010/04/11 MAGNETIC-FIELD  HETEROSTRUCTURES  RESISTANCE  DEPENDENCE   Depth distribution of the strain in the GaN layer with low-temperature AlN interlayer on Si(111) substrate studied by Rutherford backscattering/channeling 期刊论文 applied physics letters, 2004, 卷号: 85, 期号: 23, 页码: 5562-5564 Lu, Y; Cong, GW; Liu, XL; Lu, DC; Wang, ZG; Wu, MF 收藏  |  浏览/下载：21/0  |  提交时间：2010/03/17 STRESS   Wafer bonding technique used for the integration of cubic GaN/GaAs (001) with Si substrate 期刊论文 science in china series e-technological sciences, 2002, 卷号: 45, 期号: 3, 页码: 255-260 作者:  Zhang SM;  Zhao DG 收藏  |  浏览/下载：88/5  |  提交时间：2010/08/12 wafer bonding  cubic  GaN/GaAs(001)  Si-substrate  LIGHT-EMITTING-DIODES  P-TYPE GAN  RESISTANCE  CONTACT  LASER   Hydrogen behavior in GaN epilayers grown by NH3-MBE 期刊论文 journal of crystal growth, 2001, 卷号: 227, 期号: 0, 页码: 371-375 Kong MY; Zhang JP; Wang XL; Sun DZ 收藏  |  浏览/下载：101/8  |  提交时间：2010/08/12 impurities  molecular beam epitaxy  nitrides  semiconducting III-V materials  GALLIUM NITRIDE  SAPPHIRE SUBSTRATE  DEFECTS  HETEROSTRUCTURE  SEMICONDUCTORS  STRESS   Hydrogen behavior in GaN epilayers grown by NH3-MBE 会议论文 11th international conference on molecular beam epitaxy (mbe-xi), beijing, peoples r china, sep 11-15, 2000 Kong MY; Zhang JP; Wang XL; Sun DZ 收藏  |  浏览/下载：13/0  |  提交时间：2010/11/15 impurities  molecular beam epitaxy  nitrides  semiconducting III-V materials  GALLIUM NITRIDE  SAPPHIRE SUBSTRATE  DEFECTS  HETEROSTRUCTURE  SEMICONDUCTORS  STRESS