QQ客服 官方微博 反馈留言

浏览/检索结果: 共2条，第1-2条 帮助 限定条件 学科主题：半导体器件    内容类型：会议论文     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Development of current-based microscopic defect analysis method using optical filling techniques for the defect study on heavily irradiated high-resistivity Si sensors/detectors 会议论文 11th conference on defects recognition imaging and physics in semiconductors, beijing, peoples r china, sep 13-19, 2005 Li, Z (Li, Z.); Li, CJ (Li, C. J.) 收藏  |  浏览/下载：305/15  |  提交时间：2010/03/29 DLTS   Studies of 6H-SiC devices 会议论文 korea-china joint symposium on smiconductor physics and device applications, seoul, south korea, dec 05-09, 2001 Wang SR; Liu ZL 收藏  |  浏览/下载：10/0  |  提交时间：2010/11/15 SiC  Schottky  pn junction diodes  MOS capacitor  JUNCTION DIODES