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Development of current-based microscopic defect analysis method using optical filling techniques for the defect study on heavily irradiated high-resistivity Si sensors/detectors 会议论文
11th conference on defects recognition imaging and physics in semiconductors, beijing, peoples r china, sep 13-19, 2005
Li, Z (Li, Z.); Li, CJ (Li, C. J.)
收藏  |  浏览/下载:304/15  |  提交时间:2010/03/29
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Improved neutron radiation hardness for Si detectors: Application of low resistivity starting material and or manipulation of N-eff by selective filling of radiation-induced traps at low temperatures 会议论文
1998 nuclear science symposium (nss), toronto, canada, nov 08-14, 1998
Dezillie B; Li Z; Eremin V; Bruzzi M; Pirollo S; Pandey SU; Li CJ
收藏  |  浏览/下载:17/0  |  提交时间:2010/11/15


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