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科研机构
半导体研究所 [10]
内容类型
期刊论文 [9]
会议论文 [1]
发表日期
2010 [3]
2009 [1]
2008 [2]
2006 [3]
2000 [1]
学科主题
光电子学 [10]
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Structural and optical properties of Al1-xInxN epilayers on GaN template grown by metalorganic chemical vapor deposition
期刊论文
chinese physics b, 2010, 卷号: 19, 期号: 2, 页码: art. no. 026804
Lu GJ (Lu Guo-Jun)
;
Zhu JJ (Zhu Jian-Jun)
;
Jiang DS (Jiang De-Sheng)
;
Wang YT (Wang Yu-Tian)
;
Zhao DG (Zhao De-Gang)
;
Liu ZS (Liu Zong-Shun)
;
Zhang SM (Zhang Shu-Ming)
;
Yang H (Yang Hui)
收藏
  |  
浏览/下载:110/2
  |  
提交时间:2010/04/22
metalorganic chemical vapor deposition
Al1-xInxN
gradual variation in composition
optical reflectance spectra
X-RAY-DIFFRACTION
PHASE EPITAXY
RELAXATION
FILMS
HETEROSTRUCTURES
SEPARATION
DYNAMICS
ALLOYS
REGION
LAYERS
Investigation on the strain relaxation of InGaN layer and its effects on the InGaN structural and optical properties
期刊论文
physica b-condensed matter, 2010, 卷号: 405, 期号: 22, 页码: 4668-4672
Wang H (Wang H.)
;
Jiang DS (Jiang D. S.)
;
Jahn U (Jahn U.)
;
Zhu JJ (Zhu J. J.)
;
Zhao DG (Zhao D. G.)
;
Liu ZS (Liu Z. S.)
;
Zhang SM (Zhang S. M.)
;
Qiu YX (Qiu Y. X.)
;
Yang H (Yang H.)
收藏
  |  
浏览/下载:35/0
  |  
提交时间:2010/12/12
InGaN
Dislocation
Metalorganic chemical vapor deposition
High resolution X-ray diffraction
Cathodoluminescence
MISFIT DISLOCATIONS
QUANTUM-WELLS
BAND-GAP
EPILAYERS
GENERATION
ALLOYS
INN
Cathodoluminescence study on in composition inhomogeneity of thick InGaN layer
期刊论文
thin solid films, 2010, 卷号: 518, 期号: 17, 页码: 5028-5031
Wang H (Wang H.)
;
Jiang DS (Jiang D. S.)
;
Jahn U (Jahn U.)
;
Zhu JJ (Zhu J. J.)
;
Zhao DG (Zhao D. G.)
;
Liu ZS (Liu Z. S.)
;
Zhang SM (Zhang S. M.)
;
Yang H (Yang H.)
收藏
  |  
浏览/下载:60/2
  |  
提交时间:2010/08/17
Gallium Nitride
Indium Gallium Nitride
Cathodeluminescence
X-ray Diffraction
Metal-Organic Chemical Vapor Deposition
Investigation of gain recovery for InAs/GaAs quantum dot semiconductor optical amplifiers by rate equation simulation
期刊论文
optical and quantum electronics, 2009, 卷号: 41, 期号: 8, 页码: 613-626
Xiao JL (Xiao Jin-Long)
;
Yang YD (Yang Yue-De)
;
Huang YZ (Huang Yong-Zhen)
收藏
  |  
浏览/下载:89/2
  |  
提交时间:2010/08/17
Quantum dots (QDs)
Semiconductor optical amplifiers (SOAs)
Gain recovery
CARRIER DISTRIBUTION
DYNAMICS
SATURATION
RELAXATION
LASERS
MODEL
Ultrafast carrier dynamics in undoped and p-doped InAs/GaAs quantum dots characterized by pump-probe reflection measurements
期刊论文
journal of applied physics, 2008, 卷号: 103, 期号: 8, 页码: art. no. 083121
Liu, HY
;
Meng, ZM
;
Dai, QF
;
Wu, LJ
;
Guo, Q
;
Hu, W
;
Liu, SH
;
Lan, S
;
Yang, T
收藏
  |  
浏览/下载:52/3
  |  
提交时间:2010/03/08
ENERGY RELAXATION
ELECTRON RELAXATION
CAPTURE
PHONON
INAS
GAAS
TEMPERATURE
DEPENDENCE
DENSITY
TIME
Numerical analysis of gain saturation, noise figure, and carrier distribution for quantum-dot semiconductor-optical amplifiers
期刊论文
ieee journal of quantum electronics, 2008, 卷号: 44, 期号: 39939, 页码: 448-455
Xiao, JL
;
Huang, YZ
收藏
  |  
浏览/下载:37/1
  |  
提交时间:2010/03/08
gain
noise
quantum dots (QDs)
semiconductor-optical amplifiers (SOAs)
Influence of cracks generation on the structural and optical properties of GaN/Al0.55Ga0.45N multiple quantum wells
期刊论文
applied surface science, 2006, 卷号: 252, 期号: 8, 页码: 3043-3050
作者:
Zhang SM
收藏
  |  
浏览/下载:83/0
  |  
提交时间:2010/04/11
nitrides
multiple quantum wells
cracks
dislocations
vacancies x-ray diffraction
X-RAY-DIFFRACTION
EDGE DISLOCATIONS
GAN
FILMS
SUPERLATTICES
RELAXATION
STRAIN
Strain evolution in GaN layers grown on high-temperature AlN interlayers
期刊论文
applied physics letters, 2006, 卷号: 89, 期号: 15, 页码: art.no.152105
Wang JF (Wang J. F.)
;
Yao DZ (Yao D. Z.)
;
Chen J (Chen J.)
;
Zhu JJ (Zhu J. J.)
;
Zhao DG (Zhao D. G.)
;
Jiang DS (Jiang D. S.)
;
Yang H (Yang H.)
;
Liang JW (Liang J. W.)
收藏
  |  
浏览/下载:31/0
  |  
提交时间:2010/04/11
CHEMICAL-VAPOR-DEPOSITION
STRESS EVOLUTION
DEFECT STRUCTURE
EPITAXIAL GAN
THIN-FILMS
ALGAN
DISLOCATIONS
RELAXATION
REDUCTION
Comparison between double crystals X-ray diffraction micro-Raman measurement on composition determination of high Ge content Si1_xGex layer epitaxied on Si substrate
期刊论文
journal of materials science & technology, 2006, 卷号: 22, 期号: 5, 页码: 651-654
Zhao L (Zhao Lei)
;
Zuo YH (Zuo Yuhua)
;
Cheng BW (Cheng Buwen)
;
Yu JZ (Yu Jinzhong)
;
Wang QM (Wang Qiming)
收藏
  |  
浏览/下载:38/0
  |  
提交时间:2010/04/11
Si1_xGex
Ge content
composition determination
double crystals X-ray diffraction (DCXRD)
micro-Raman measurement
BAND-GAP
HETEROSTRUCTURES
SUPERLATTICES
ALLOYS
RELAXATION
SCATTERING
THICKNESS
STRAIN
In situ annealing during the growth of relaxed SiGe
会议论文
conference on optical and infrared thin films, san diego, ca, 36739
Li DZ
;
Huang CJ
;
Cheng BW
;
Wang HJ
;
Yu Z
;
Zhang CH
;
Yu JZ
;
Wang QM
收藏
  |  
浏览/下载:14/0
  |  
提交时间:2010/10/29
Ultrahigh Vacuum Chemical Vapor Deposition
SiGe
Refractive High Energy Electron Diffraction
tansmission electron microscopy
Double Crystal X-Ray Diffraction
MOBILITY 2-DIMENSIONAL ELECTRON
CRITICAL THICKNESS
STRAINED LAYERS
GE
RELAXATION
EPILAYERS
SI1-XGEX
GESI/SI
GASES
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