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科研机构
半导体研究所 [8]
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期刊论文 [8]
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2011 [1]
2010 [2]
2009 [1]
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光电子学 [8]
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A new method to measure the carrier concentration of p-GaN
期刊论文
acta physica sinica, 2011, 卷号: 60, 期号: 3, 页码: article no.37804
Zhou M
;
Zhao DG
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浏览/下载:66/7
  |  
提交时间:2011/07/05
p-GaN
carrier concentration measurement
ultraviolet photodetector
LASER-DIODES
FILMS
Evaluation of both composition and strain distributions in InGaN epitaxial film using x-ray diffraction techniques
期刊论文
chinese physics b, 2010, 卷号: 19, 期号: 10, 页码: art. no. 106802
Guo X (Guo Xi)
;
Wang H (Wang Hui)
;
Jiang DS (Jiang De-Sheng)
;
Wang YT (Wang Yu-Tian)
;
Zhao DG (Zhao De-Gang)
;
Zhu JJ (Zhu Jian-Jun)
;
Liu ZS (Liu Zong-Shun)
;
Zhang SM (Zhang Shu-Ming)
;
Yang H (Yang Hui)
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  |  
浏览/下载:28/0
  |  
提交时间:2010/11/02
InGaN
In-plane grazing incidence x-ray diffraction
reciprocal space mapping
biaxial strain
CRITICAL LAYER THICKNESS
OPTICAL-PROPERTIES
LATTICE-CONSTANTS
GAN
HETEROSTRUCTURES
ALLOYS
WELLS
Microstructure and strain analysis of GaN epitaxial films using in-plane grazing incidence x-ray diffraction
期刊论文
chinese physics b, 2010, 卷号: 19, 期号: 7, 页码: art. no. 076804
Guo X (Guo Xi)
;
Wang YT (Wang Yu-Tian)
;
Zhao DG (Zhao De-Gang)
;
Jiang DS (Jiang De-Sheng)
;
Zhu JJ (Zhu Jian-Jun)
;
Liu ZS (Liu Zong-Shun)
;
Wang H (Wang Hui)
;
Zhang SM (Zhang Shu-Ming)
;
Qiu YX (Qiu Yong-Xin)
;
Xu K (Xu Ke)
;
Yang H (Yang Hui)
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  |  
浏览/下载:63/0
  |  
提交时间:2010/08/17
in-plane grazing incidence x-ray diffraction
gallium nitride
mosaic structure
biaxial strain
CHEMICAL-VAPOR-DEPOSITION
LATTICE-CONSTANTS
ALN
Thickness dependent dislocation, electrical and optical properties in InN films grown by MOCVD
期刊论文
acta physica sinica, 2009, 卷号: 58, 期号: 5, 页码: 3416-3420
作者:
Li Y
;
Chen P
;
Jiang DS
;
Wang H
;
Wang ZG
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  |  
浏览/下载:49/4
  |  
提交时间:2010/03/08
InN
dislocation
carrier origination
localization
Ultrafast carrier dynamics in undoped and p-doped InAs/GaAs quantum dots characterized by pump-probe reflection measurements
期刊论文
journal of applied physics, 2008, 卷号: 103, 期号: 8, 页码: art. no. 083121
Liu, HY
;
Meng, ZM
;
Dai, QF
;
Wu, LJ
;
Guo, Q
;
Hu, W
;
Liu, SH
;
Lan, S
;
Yang, T
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  |  
浏览/下载:52/3
  |  
提交时间:2010/03/08
ENERGY RELAXATION
ELECTRON RELAXATION
CAPTURE
PHONON
INAS
GAAS
TEMPERATURE
DEPENDENCE
DENSITY
TIME
Stress evolution influenced by oxide charges on GaN metal-organic chemical vapor deposition on silicon-on-insulator substrate
期刊论文
applied physics a-materials science & processing, 2007, 卷号: 89, 期号: 1, 页码: 177-181
Sun J
;
Chen J
;
Wang X
;
Wang J
;
Liu W
;
Zhu J
;
Yang H
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  |  
浏览/下载:43/0
  |  
提交时间:2010/03/29
GROWTH
Comparison between double crystals X-ray diffraction micro-Raman measurement on composition determination of high Ge content Si1_xGex layer epitaxied on Si substrate
期刊论文
journal of materials science & technology, 2006, 卷号: 22, 期号: 5, 页码: 651-654
Zhao L (Zhao Lei)
;
Zuo YH (Zuo Yuhua)
;
Cheng BW (Cheng Buwen)
;
Yu JZ (Yu Jinzhong)
;
Wang QM (Wang Qiming)
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  |  
浏览/下载:37/0
  |  
提交时间:2010/04/11
Si1_xGex
Ge content
composition determination
double crystals X-ray diffraction (DCXRD)
micro-Raman measurement
BAND-GAP
HETEROSTRUCTURES
SUPERLATTICES
ALLOYS
RELAXATION
SCATTERING
THICKNESS
STRAIN
Evolution of mosaic structure in InN grown by metalorganic chemical vapor deposition
期刊论文
journal of crystal growth, 2006, 卷号: 293, 期号: 2, 页码: 269-272
Huang Y (Huang Y.)
;
Wang H (Wang H.)
;
Sun Q (Sun Q.)
;
Chen J (Chen J.)
;
Li DY (Li D. Y.)
;
Zhang JC (Zhang J. C.)
;
Wang JF (Wang J. F.)
;
Wang YT (Wang Y. T.)
;
Yang H (Yang H.)
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  |  
浏览/下载:48/0
  |  
提交时间:2010/04/11
growth mode
X-ray diffraction
metalorganic chemical vapor deposition
indium nitride
X-RAY-DIFFRACTION
THREADING DISLOCATIONS
ELECTRON-TRANSPORT
BUFFER LAYER
THIN-FILMS
GAN FILMS
SAPPHIRE
ALN
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