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科研机构
半导体研究所 [32]
内容类型
期刊论文 [29]
会议论文 [3]
发表日期
2014 [1]
2011 [1]
2010 [4]
2009 [2]
2008 [4]
2007 [6]
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学科主题
光电子学 [32]
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Unintentionally doped semi-insulating GaN with a low dislocation density grown by metalorganic chemical vapor deposition
期刊论文
journal of vacuum science & technology b, 2014, 卷号: 32, 期号: 5, 页码: 051207
He, XG
;
Zhao, DG
;
Jiang, DS
;
Zhu, JJ
;
Chen, P
;
Liu, ZS
;
Le, LC
;
Yang, J
;
Li, XJ
;
Zhang, SM
;
Yang, H
收藏
  |  
浏览/下载:28/0
  |  
提交时间:2015/03/25
A practical route towards fabricating GaN nanowire arrays
期刊论文
crystengcomm, 2011, 卷号: 13, 期号: 19, 页码: 5929-5935
Liu, JQ
;
Huang, J
;
Gong, XJ
;
Wang, JF
;
Xu, K
;
Qiu, YX
;
Cai, DM
;
Zhou, TF
;
Ren, GQ
;
Yang, H
收藏
  |  
浏览/下载:26/0
  |  
提交时间:2012/02/06
LIGHT-EMITTING-DIODES
EPITAXIAL LATERAL OVERGROWTH
CHEMICAL-VAPOR-DEPOSITION
WELL NANOROD ARRAYS
ULTRAVIOLET-LIGHT
GROWTH
NANOGENERATORS
DISLOCATIONS
BRIGHTNESS
LAYERS
Influence of AlN buffer layer thickness on structural properties of GaN epilayer grown on Si (111) substrate with AlGaN interlayer
期刊论文
chinese physics b, 2010, 卷号: 19, 期号: 3, 页码: art. no. 036801
Wu YX (Wu Yu-Xin)
;
Zhu JJ (Zhu Jian-Jun)
;
Chen GF (Chen Gui-Feng)
;
Zhang SM (Zhang Shu-Ming)
;
Jiang DS (Jiang De-Sheng)
;
Liu ZS (Liu Zong-Shun)
;
Zhao DG (Zhao De-Gang)
;
Wang H (Wang Hui)
;
Wang YT (Wang Yu-Tian)
;
Yang H (Yang Hui)
收藏
  |  
浏览/下载:127/4
  |  
提交时间:2010/04/13
GaN
Si (111) substrate
metalorganic chemical vapour deposition
AlN buffer layer
AlGaN interlayer
: VAPOR-PHASE EPITAXY
CRACK-FREE GAN
STRESS-CONTROL
SI(111)
DEPOSITION
ALXGA1-XN
FILM
Effect of surface treatment of GaN based light emitting diode wafers on the leakage current of light emitting diode devices
期刊论文
chinese physics b, 2010, 卷号: 19, 期号: 1, 页码: art. no. 017307
作者:
Zhang SM
;
Wang LJ
;
Wang YT
;
Yang H
;
Wang LJ
收藏
  |  
浏览/下载:107/3
  |  
提交时间:2010/04/05
GaN
light emitting diode
surface treatment
leakage current
THREADING DISLOCATION DENSITIES
LAYERS
NI/AU
LEDS
Investigation on the strain relaxation of InGaN layer and its effects on the InGaN structural and optical properties
期刊论文
physica b-condensed matter, 2010, 卷号: 405, 期号: 22, 页码: 4668-4672
Wang H (Wang H.)
;
Jiang DS (Jiang D. S.)
;
Jahn U (Jahn U.)
;
Zhu JJ (Zhu J. J.)
;
Zhao DG (Zhao D. G.)
;
Liu ZS (Liu Z. S.)
;
Zhang SM (Zhang S. M.)
;
Qiu YX (Qiu Y. X.)
;
Yang H (Yang H.)
收藏
  |  
浏览/下载:35/0
  |  
提交时间:2010/12/12
InGaN
Dislocation
Metalorganic chemical vapor deposition
High resolution X-ray diffraction
Cathodoluminescence
MISFIT DISLOCATIONS
QUANTUM-WELLS
BAND-GAP
EPILAYERS
GENERATION
ALLOYS
INN
Role of Ga vacancies in enhancing the leakage current of GaN Schottky barrier ultraviolet photodetectors
期刊论文
chinese physics b, 2010, 卷号: 19, 期号: 5, 页码: art. no. 057802
Zhao DG (Zhao De-Gang)
;
Zhang S (Zhang Shuang)
;
Liu WB (Liu Wen-Bao)
;
Hao XP (Hao Xiao-Peng)
;
Jiang DS (Jiang De-Sheng)
;
Zhu JJ (Zhu Jian-Jun)
;
Liu ZS (Liu Zong-Shun)
;
Wang H (Wang Hui)
;
Zhang SM (Zhang Shu-Ming)
;
Yang H (Yang Hui)
;
Wei L (Wei Long)
收藏
  |  
浏览/下载:73/2
  |  
提交时间:2010/05/24
Ga vacancies
MOCVD
GaN
Schottky barrier photodetector
REVERSE-BIAS LEAKAGE
MOLECULAR-BEAM EPITAXY
P-N-JUNCTIONS
POSITRON-ANNIHILATION
DIODES
FILMS
Stable multiplication gain in GaN p-i-n avalanche photodiodes with large device area
期刊论文
journal of physics d-applied physics, 2009, 卷号: 42, 期号: 1, 页码: art. no. 015108
作者:
Wang H
;
Zhao DG
;
Zhang SM
;
Yang H
;
Yang H
收藏
  |  
浏览/下载:168/40
  |  
提交时间:2010/03/08
SURFACE-MORPHOLOGY
DETECTORS
GROWTH
Thickness dependent dislocation, electrical and optical properties in InN films grown by MOCVD
期刊论文
acta physica sinica, 2009, 卷号: 58, 期号: 5, 页码: 3416-3420
作者:
Li Y
;
Chen P
;
Jiang DS
;
Wang H
;
Wang ZG
收藏
  |  
浏览/下载:49/4
  |  
提交时间:2010/03/08
InN
dislocation
carrier origination
localization
High-temperature AlN interlayer for crack-free AlGaN growth on GaN
期刊论文
journal of applied physics, 2008, 卷号: 104, 期号: 4, 页码: art. no. 043516
Sun, Q
;
Wang, JT
;
Wang, H
;
Jin, RQ
;
Jiang, DS
;
Zhu, JJ
;
Zhao, DG
;
Yang, H
;
Zhou, SQ
;
Wu, MF
;
Smeets, D
;
Vantomme, A
收藏
  |  
浏览/下载:73/0
  |  
提交时间:2010/03/08
STRESS
SI(111)
REDUCTION
THICKNESS
Investigation on the structural origin of n-type conductivity in InN films
期刊论文
journal of physics d-applied physics, 2008, 卷号: 41, 期号: 13, 页码: art. no. 135403
Wang, H
;
Jiang, DS
;
Wang, LL
;
Sun, X
;
Liu, WB
;
Zhao, DG
;
Zhu, JJ
;
Liu, ZS
;
Wang, YT
;
Zhang, SM
;
Yang, H
收藏
  |  
浏览/下载:53/1
  |  
提交时间:2010/03/08
MOLECULAR-BEAM EPITAXY
GAN FILMS
DISLOCATION SCATTERING
LAYER THICKNESS
INDIUM NITRIDE
BAND-GAP
VACANCIES
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