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Focused ion beam preparation of microbeams forin situmechanical analysis of electroplated nanotwinned copper with probe type indenters 期刊论文
JOURNAL OF MICROSCOPY, 2020, 卷号: 279, 期号: 3, 页码: 212-216
作者:  Robertson, Stuart;  Doak, Scott;  Sun, Fu-Long;  Liu, Zhi-Quan;  Liu, Changqing
收藏  |  浏览/下载:32/0  |  提交时间:2021/02/02
Influence of Wax Lubrication on Cutting Performance of Single-Crystal Silicon in Ultraprecision Microgrooving 期刊论文
International Journal of Precision Engineering and Manufacturing-Green Technology, 2020, 页码: 14
作者:  S. N. A. Kalkhoran,M. Vandati,Z. Y. Zhang and J. W. Yan
收藏  |  浏览/下载:2/0  |  提交时间:2021/07/06


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