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Single-event induced failure mode of PWM in DC/DC converter 期刊论文
MICROELECTRONICS RELIABILITY, 2020, 卷号: 114, 页码: 6
作者:  Gao, J.;  Li, C.;  Li, B.;  Li, B.;  Zhao, F.
收藏  |  浏览/下载:6/0  |  提交时间:2021/12/13


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