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Single-event induced failure mode of PWM in DC/DC converter 期刊论文
MICROELECTRONICS RELIABILITY, 2020, 卷号: 114, 页码: 6
作者:  Gao, J.;  Li, C.;  Li, B.;  Li, B.;  Zhao, F.
收藏  |  浏览/下载:6/0  |  提交时间:2021/12/13
The open-pin failure of power device under the combined effect of thermo-migration and electro-migration 期刊论文
Chinese Science Bulletin, 2020, 卷号: 65, 期号: 20, 页码: 2169-2177
作者:  Gao Liyin;  Li Caifu;  Cao Lihua;  Liu Zhiquan
收藏  |  浏览/下载:17/0  |  提交时间:2021/02/03


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