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Roles of the Gate Length and Width of the Transistors in Increasing the Single Event Upset Resistance of SRAM cells 会议论文
作者:  Han ZS(韩郑生);  Luo JJ(罗家俊);  Zheng ZS(郑中山)
收藏  |  浏览/下载：6/0  |  提交时间：2018/07/20
A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM 期刊论文
Nuclear Instruments and Methods in Physics Research B, 2017
作者:  Ceng CB(曾传滨);  Zhao FZ(赵发展);  Yan WW(闫薇薇)
收藏  |  浏览/下载：15/0  |  提交时间：2018/05/16
A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM 会议论文
作者:  Yan, Weiwei;  Wang, Bin;  Zeng, Chuanbin;  Geng, Chao;  Liu, Tianqi
收藏  |  浏览/下载：40/0  |  提交时间：2018/08/20
Low energy proton induced single event upset in 65 nm DDR and QDR commercial SRAMs 会议论文
作者:  Ye, B.;  Liu, J.;  Wang, T. S.;  Liu, T. Q.;  Maaz, K.
收藏  |  浏览/下载：19/0  |  提交时间：2018/08/20
A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 卷号: 406, 页码: 437-442
作者:  Wang, Bin;  Zeng, Chuanbin;  Geng, Chao;  Liu, Tianqi;  Khan, Maaz
收藏  |  浏览/下载：35/0  |  提交时间：2018/05/31
Low energy proton induced single event upset in 65 nm DDR and QDR commercial SRAMs 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 卷号: 406, 页码: 443-448
作者:  Ye, B.;  Liu, J.;  Wang, T. S.;  Liu, T. Q.;  Maaz, K.
收藏  |  浏览/下载：13/0  |  提交时间：2018/05/31
Impact of energy straggle on proton-induced single event upset test in a 65-nm SRAM cell 期刊论文
CHINESE PHYSICS B, 2017, 卷号: 26, 页码: 6
作者:  Ye, Bing;  Liu, Jie;  Wang, Tie-Shan;  Liu, Tian-Qi;  Luo, Jie
收藏  |  浏览/下载：19/0  |  提交时间：2018/05/31
Application of SEU imaging for analysis of device architecture using a 25 MeV/u Kr-86 ion microbeam at HIRFL 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 卷号: 404, 页码: 254-258
作者:  Wang, Bin;  Liu, Tianqi;  Liu, Jie;  Yang, Zhenlei;  Guo, Jinlong
收藏  |  浏览/下载：27/0  |  提交时间：2018/05/31
Development of single-event-effects analysis system at the IMP microbeam facility 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 卷号: 404, 页码: 250-253
作者:  Du, Guanghua;  Bi, Jinshun;  Ma, Shuyi;  Liu, Xiaojun;  Sheng, Lina
收藏  |  浏览/下载：26/0  |  提交时间：2018/05/31

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