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Effects of Post Annealing Treatments on the Interfacial Chemical Properties and Band Alignment of AlN/Si Structure Prepared by Atomic Layer Deposition 期刊论文
Nanoscale Research Letters, 2017, 卷号: 12
作者:  Sun, L.;  H. L. Lu;  H. Y. Chen;  T. Wang;  X. M. Ji
收藏  |  浏览/下载:20/0  |  提交时间:2018/06/13
Atomic Layer Deposition of HfO2 Gate Dielectric with Surface Treatments and Post-metallization Annealing for Germanium MOSFETs 会议论文
作者:  Liu, Qifeng;  Lam, Sang;  Mu, Yifei;  Zhao, Ce Zhou;  Zhao, Yinchao
收藏  |  浏览/下载:13/0  |  提交时间:2019/11/26


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