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Determination of cut-off time of accelerated aging test under temperature stress for LED lamps 期刊论文
Frontiers of Information Technology & Electronic Engineering, 2017, 卷号: 18, 期号: 8
作者:  Hao, J.;  L. Jing;  H. L. Ke;  Y. Wang;  Q. Gao
收藏  |  浏览/下载:15/0  |  提交时间:2018/06/13


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