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合肥物质科学研究院 [13]
北京大学 [10]
清华大学 [8]
西安交通大学 [5]
山东大学 [2]
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期刊论文 [53]
会议论文 [4]
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2016 [59]
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Baking-temperature-modulated optical and electrical properties of HfTiOx gate dielectrics via sol-gel method
期刊论文
JOURNAL OF ALLOYS AND COMPOUNDS, 2016, 卷号: 688, 期号: 无, 页码: 925-932
作者:
Jin, P.
;
He, G.
;
Wang, P. H.
;
Liu, M.
;
Xiao, D. Q.
收藏
  |  
浏览/下载:57/0
  |  
提交时间:2017/09/11
High-k Gate Dielectrics
Hftiox Thin Films
Sol-gel Processing
Optical Properties
Electrical Properties
Modification of optical and electrical properties of sol-gel-derived TiO2-doped ZrO2 gate dielectrics by annealing temperature
期刊论文
JOURNAL OF ALLOYS AND COMPOUNDS, 2016, 卷号: 688, 期号: 无, 页码: 252-259
作者:
Xiao, D. Q.
;
He, G.
;
Liu, M.
;
Gao, J.
;
Jin, P.
收藏
  |  
浏览/下载:34/0
  |  
提交时间:2017/10/18
High-k Gate Dielectrics
Optical Constant
Electrical Properties
Ti incorporaTion
Sol-gel
Conduction Mechanisms
HEATING MECHANISMS IN THE LOW SOLAR ATMOSPHERE THROUGH MAGNETIC RECONNECTION IN CURRENT SHEETS
期刊论文
ASTROPHYSICAL JOURNAL, 2016, 卷号: 832, 期号: 2
作者:
Ni L(倪蕾)
;
Lin J(林隽)
;
Ilia I. Roussev
;
Brigitte Schmieder
收藏
  |  
浏览/下载:27/0
  |  
提交时间:2017/01/12
Magnetic Reconnection
Magnetohydrodynamics (Mhd)
Shock Waves
Sun: Chromosphere
HEATING MECHANISMS IN THE LOW SOLAR ATMOSPHERE THROUGH MAGNETIC RECONNECTION IN CURRENT SHEETS
期刊论文
ASTROPHYSICAL JOURNAL, 2016, 卷号: 832, 期号: 2, 页码: 11
作者:
Ni, Lei
;
Lin, Jun
;
Roussev, Ilia I.
;
Schmieder, Brigitte
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  |  
浏览/下载:0/0
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提交时间:2020/03/10
magnetic reconnection
magnetohydrodynamics (MHD)
shock waves
Sun: chromosphere
Thermally accelerated ageing test of 808nm high power diode laser arrays in CW mode
会议论文
17th international conference on electronic packaging technology, icept 2016, wuhan, china, 2016-08-16
作者:
Nie, Zhiqiang
;
Wu, Di
;
Lu, Yao
;
Wu, Dhai
;
Wang, Shuna
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  |  
浏览/下载:85/0
  |  
提交时间:2016/11/22
Chip scale packages
Defects
Degradation
Electronics packaging
High power lasers
Laser beam welding
Power semiconductor diodes
Reliability
Reliability analysis
Semiconductor diodes
Modification of band alignments and optimization of electrical properties of InGaZnO MOS capacitors with high-k HfOxNy gate dielectrics
期刊论文
JOURNAL OF ALLOYS AND COMPOUNDS, 2016, 卷号: 679, 期号: 无, 页码: 115-121
作者:
Zheng, C. Y.
;
He, G.
;
Chen, X. F.
;
Liu, M.
;
Lv, J. G.
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  |  
浏览/下载:19/0
  |  
提交时间:2017/10/18
Band Offset
Hfo2/ingazno4 Heterojunctions
X-ray Photoelectron Spectroscopy
Thin Film Transistors
Electrical Properties
Mos Capacitor
Pressure-induced improvement of grain boundary properties in yttrium-doped bazro3
期刊论文
Journal of physics d-applied physics, 2016, 卷号: 49, 期号: 34, 页码: 8
作者:
Wu, Lei
;
Dai, LiDong
;
Li, HePing
;
Zhuang, Yukai
;
Liu, KaiXiang
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  |  
浏览/下载:38/0
  |  
提交时间:2019/05/09
Yttrium-doped
High pressure
Impedance spectroscopy
Conductivity
Annealing Temperature Dependent Electrical Properties and Leakage Current Transport Mechanisms in Atomic Layer Deposition-Derived Al2O3-Incorporated HfO2/Si Gate Stack
期刊论文
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2016, 卷号: 16, 期号: 8, 页码: 8075-8082
作者:
Gao, Juan
;
He, Gang
;
Zhang, Jiwen
;
Chen, Xuefei
;
Jin, Peng
收藏
  |  
浏览/下载:22/0
  |  
提交时间:2017/11/21
High-k Gate Dielectric
Atomic Layer Deposition
Electrical Properties
Leakage Current Mechanism
Microstructure, optical and electrical properties of sputtered HfFiO high-k gate dielectric thin films
期刊论文
CERAMICS INTERNATIONAL, 2016, 卷号: 42, 期号: 10, 页码: 11640-11649
作者:
Jiang, S. S.
;
He, G.
;
Gao, J.
;
Xiao, D. Q.
;
Jin, P.
收藏
  |  
浏览/下载:23/0
  |  
提交时间:2017/10/18
Electrical Properties
High-k Gate Dielectrics
Metal-oxide-semiconductor
Conduction Mechanisms
Sputtering
Coexistence of resistance switching and negative differential resistance in the alpha-Fe2O3 nanorod film
期刊论文
PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2016, 卷号: 18, 期号: 26, 页码: 17440-17445
作者:
Cai, Yunyu
;
Yuan, Qinglin
;
Ye, Yixing
;
Liu, Jun
;
Liang, Changhao
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  |  
浏览/下载:18/0
  |  
提交时间:2016/12/15
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