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Mechanism of electron multiplication due to charging for a SiO2 sample with a buried microstructure in SEM: A simulation analysis 期刊论文
MICRON, 2016, 卷号: 90, 期号: [db:dc_citation_issue], 页码: 64-70
作者:  Wang, Fang;  Feng, Guobao;  Zhang, Xiusheng;  Cao, Meng
收藏  |  浏览/下载:2/0  |  提交时间:2019/12/02
Sensitivity analysis of the recycling process at the second stage of the PWR-ADS fuel cycle 会议论文
作者:  Zhou, Shengcheng;  Zheng, Youqi;  Wu, Hongchun;  Cao, Liangzhi
收藏  |  浏览/下载:4/0  |  提交时间:2019/11/26


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