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浏览/检索结果: 共6条，第1-6条 帮助 限定条件 发表日期：2016    内容类型：期刊论文    专题：北京大学    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Novel Vertical 3D Structure of TaOx-based RRAM with Self-localized Switching Region by Sidewall Electrode Oxidation 期刊论文 SCIENTIFIC REPORTS, 2016 Yu, Muxi; Cai, Yimao; Wang, Zongwei; Fang, Yichen; Liu, Yefan; Yu, Zhizhen; Pan, Yue; Zhang, Zhenxing; Tan, Jing; Yang, Xue; Li, Ming; Huang, Ru 收藏  |  浏览/下载：7/0  |  提交时间：2017/12/03 NONVOLATILE MEMORY TECHNOLOGIES  THERMAL-OXIDATION  RESISTIVE MEMORY  EDGE ELECTRODES  THIN-FILMS  RESISTANCE  DEVICE  BEHAVIORS  FILAMENT  OXYGEN   Bimaterial Cantilever Focal Plane Array for Uncooled Infrared Imaging Using Sandwich-Framed Structure 期刊论文 JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2016 Ma, Wei; Zhao, Rui; Wang, Shuyang; Yu, Xiaomei; Feng, Yun; Zhao, Yuejing 收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03 Focal plane array (FPA)  infrared (IR) imaging  sandwiched frame  trench backfill technique  PERFORMANCE  DETECTORS  DESIGN  FABRICATION   Self-Selection RRAM Cell With Sub-mu A Switching Current and Robust Reliability Fabricated by High-K/Metal Gate CMOS Compatible Technology 期刊论文 IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016 Huang, Peng; Chen, Sijie; Zhao, Yudi; Chen, Bing; Gao, Bin; Liu, Lifeng; Chen, Yong; Zhang, Ziying; Bu, Weihai; Wu, Hanming; Liu, Xiaoyan; Kang, Jinfeng 收藏  |  浏览/下载：9/0  |  提交时间：2017/12/03 High-K/metal gate (HKMG)  nonliner  resistive random access memory (RRAM)  resistive switching  retention  ultralow switching current  OXIDE-BASED RRAM  DEVICE CHARACTERISTICS  CROSSBAR ARRAY  RESISTANCE  MODEL   Effect of SiO2 Buffer Layer Thickness on Performance and Reliability of Flexible Polycrystalline Silicon TFTs Fabricated on Polyimide 期刊论文 IEEE ELECTRON DEVICE LETTERS, 2016 Chen, Bo-Wei; Chang, Ting-Chang; Hung, Yu-Ju; Huang, Shin-Ping; Chen, Hua-Mao; Huang, Hui-Chun; Liao, Po-Yung; Chiang, Hsiao-Cheng; Zheng, Yu-Zhe; Yeh, Wei-Heng; Lin, Yu-Ho; Liang, Jonathan Siher; Chu, Ann-Kuo; Li, Hung-Wei; Tsai, Chih-Hung; Lu, Hsueh-Hsing 收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03 Flexible electronics  LTPS TFTs  ELA crystallization  thermal expansion stress  THIN-FILM TRANSISTORS  BIAS TEMPERATURE INSTABILITY  NBTI DEGRADATION   Wireless Physical-Layer Identification: Modeling and Validation 期刊论文 IEEE TRANSACTIONS ON INFORMATION FORENSICS AND SECURITY, 2016 Wang, Wenhao; Sun, Zhi; Piao, Sixu; Zhu, Bocheng; Ren, Kui 收藏  |  浏览/下载：5/0  |  提交时间：2017/12/04 Radio frequency fingerprinting  physical-layer security  wireless communication  multipath channels  SPECTRAL REGROWTH  FINGERPRINTS  USERS   High Performance Metal-Gate/High-kappa GaN MOSFET With Good Reliability for Both Logic and Power Applications 期刊论文 IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, 2016 Yi, Shih-Han; Ruan, Dun-Bao; Di, Shaoyan; Liu, Xiaoyan; Wu, Yung Hsien; Chin, Albert 收藏  |  浏览/下载：8/0  |  提交时间：2017/12/04 GaN  MOSFET  high-kappa  reliability  interface  ELECTRON-MOBILITY TRANSISTORS  INSULATOR