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浏览/检索结果: 共5条，第1-5条 帮助 限定条件 发表日期：2014    专题：北京大学    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Enhancement Mode (E-Mode) AlGaN/GaN MOSFET With 10(-13) A/mm Leakage Current and 10(12) ON/OFF Current Ratio 期刊论文 ieee electron device letters, 2014 Xu, Zhe; Wang, Jinyan; Cai, Yong; Liu, Jingqian; Jin, Chunyan; Yang, Zhenchuan; Wang, Maojun; Yu, Min; Xie, Bing; Wu, Wengang; Ma, Xiaohua; Zhang, Jincheng; Hao, Yue 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/10 Post-gate annealing (PGA)  GaN  enhancement mode  MOSFET  ON/OFF current ratio  mesa isolation current  GAN MIS-HEMTS  AL2O3/GAN MOSFET  INTERFACE   High temperature behavior of multi-region direct current current-voltage spectroscopy and relationship with shallow-trench-isolation-based high-voltage laterally diffused metal-oxide-semiconductor field-effect-transistors reliability 期刊论文 日本应用物理学杂志, 2014 He, Yandong; Zhang, Ganggang; Zhang, Xing 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/10 INTERFACE TRAPS  SMART POWER  LDMOS  PHYSICS  DCIV   Total ionizing dose (TID) effect and single event effect (SEE) in quasi-SOI nMOSFETs 期刊论文 semiconductor science and technology, 2014 Tan, Fei; Huang, Ru; An, Xia; Wu, Weikang; Feng, Hui; Huang, Liangxi; Fan, Jiewen; Zhang, Xing; Wang, Yangyuan 收藏  |  浏览/下载：5/0  |  提交时间：2015/11/13 quasi-SOI device  single event effect (SEE)  total ionizing dose (TID)  worst case  TECHNOLOGIES  TRANSISTOR  CANDIDATE  MOSFET  UPSET   A CMOS compatible process for monolithic integration of high-aspect-ratio bulk silicon microstructures 期刊论文 Science China(Information Sciences), 2014 QIAN Liang; YANG ZhenChuan; YAN GuiZhen 收藏  |  浏览/下载：1/0  |  提交时间：2017/12/03 monolithic integration  trench isolation  CMOS compatibility  high-aspect-ratio  bulk micromachining   High temperature behavior of multi-region direct current current-voltage spectroscopy and relationship with shallow-trench-isolation-based high-voltage laterally diffused metal-oxide-semiconductor field-effect-transistors reliability 其他 2014-01-01 He, Yandong; Zhang, Ganggang; Zhang, Xing 收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03