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Experimental study on the oxide trap coupling effect in metal oxide semiconductor field effect transistors with HfO2 gate dielectrics 期刊论文
应用物理学快报, 2014
Ren, Pengpeng; Wang, Runsheng; Jiang, Xiaobo; Qiu, Yingxin; Liu, Changze; Huang, Ru
收藏  |  浏览/下载:6/0  |  提交时间:2015/11/10
High temperature behavior of multi-region direct current current-voltage spectroscopy and relationship with shallow-trench-isolation-based high-voltage laterally diffused metal-oxide-semiconductor field-effect-transistors reliability 期刊论文
日本应用物理学杂志, 2014
He, Yandong; Zhang, Ganggang; Zhang, Xing
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/10


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