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High temperature behavior of multi-region direct current current-voltage spectroscopy and relationship with shallow-trench-isolation-based high-voltage laterally diffused metal-oxide-semiconductor field-effect-transistors reliability 其他
2014-01-01
He, Yandong; Zhang, Ganggang; Zhang, Xing
收藏  |  浏览/下载:5/0  |  提交时间:2017/12/03
Understanding the Correlation of HCI and NBTI Degradation in pLDMOSFETs from MR-DCIV Technique 其他
2014-01-01
He, Yandong; Zhang, Ganggang; Zhang, Xing
收藏  |  浏览/下载:11/0  |  提交时间:2015/11/13
Understanding of self-heating enhanced degradation in pLDMOSFETs by MR-DCIV method 其他
2014-01-01
He, Yandong; Zhang, Ganggang; Zhang, Xing
收藏  |  浏览/下载:1/0  |  提交时间:2015/11/13


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