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Effect of bandgap engineering on the performance and reliability of a high-k based nanoscale charge trap flash memory 期刊论文
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2012, 卷号: 45, 期号: 6
Zhu, CX; Xu, ZG; Huo, ZL; Zheng, ZW; Cui, YX; Wang, YM; Liu, J; Li, FH; Liu, M
收藏  |  浏览/下载:14/0  |  提交时间:2013/09/17
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