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Threading dislocation density comparison between GaN grown on the patterned and conventional sapphire substrate by high resolution X-ray diffraction 期刊论文
SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY, 2010, 卷号: 53, 期号: 3, 页码: 465
Zhang, YC; Xing, ZG; Ma, ZG; Chen, Y; Ding, GJ; Xu, PQ; Dong, CM; Chen, H; Le, XY
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