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Thermal cycling aging effect on the shear strength, microstructure, intermetallic compounds (IMC) and crack initiation and propagation of reflow soldered Sn-3.8Ag-0.7Cu and wave soldered Sn-3.5Ag ceramic chip components 期刊论文
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2008, 卷号: 31, 页码: 331-344
作者:  Andersson, Cristina[1];  Tegehall, Per-Erik[2];  Anderssn, Dag R.[3];  Wetter, Goeran[4];  Liu, Johan[5]
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