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Raman spectroscopic characterization of the microstructure of V2O5 films 会议论文
4th International Conference on Materials for Advanced Technologies, Singapore, SINGAPORE, JUL 01-06, 2007
作者:  Su, Q;  Liu, XQ;  Ma, HL;  Guo, YP;  Wang, YY
收藏  |  浏览/下载:8/0  |  提交时间:2015/07/31
An automatic imaging spectroscopic ellipsometer for characterization of nano-film pattern on solid substrate 会议论文
4th International Conference on Spectroscopic Ellipsometry (ICSE-4), Stockholm, SWEDEN, JUN 11-15, 2007
作者:  Chen YY(陈艳艳)
收藏  |  浏览/下载:8/0  |  提交时间:2010/01/15
Tourmalines from the Koktokay No.3 pegmatite, Altai, NW China: spectroscopic characterization and relationships with the pegmatite evolution 会议论文
6th European Conference on Mineralogy and Spectroscopy, Stockholm, SWEDEN, 2007
Zhang, AC; Wang, RC; Li, YL; Hu, H; Lu, XC; Ji, JF; Zhang, H
收藏  |  浏览/下载:17/0  |  提交时间:2010/04/15
An automatic imaging spectroscopic ellipsometer for characterization of nano-film pattern on solid substrate 会议论文
4th International Conference on Spectroscopic Ellipsometry (ICSE-4), Stockholm, SWEDEN, JUN 11-15, 2007
作者:  Meng YH(孟永宏);  Chen YY(陈艳艳);  Qi C(齐财);  Liu L(刘丽);  Jin G(靳刚)
收藏  |  浏览/下载:1153/91  |  提交时间:2009/07/23


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