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Structural evaluation of polycrystalline silicon thin films by hot-wire-assisted pecvd 期刊论文
Thin solid films, 2001, 卷号: 395, 期号: 1-2, 页码: 213-216
作者:  Feng, Y;  Zhu, M;  Liu, F;  Liu, J;  Han, H
收藏  |  浏览/下载:17/0  |  提交时间:2019/05/12
Structural evaluation of polycrystalline silicon thin films by hot-wire-assisted PECVD 期刊论文
thin solid films, 2001, 卷号: 395, 期号: 1-2, 页码: 213-216
Feng Y; Zhu M; Liu F; Liu J; Han H; Han Y
收藏  |  浏览/下载:162/11  |  提交时间:2010/08/12
Structural evaluation of polycrystalline silicon thin films by hot-wire-assisted PECVD 会议论文
1st international conference on cat-cvd (hot wire cvd) process, kanazawa, japan, nov 14-17, 2000
Feng Y; Zhu M; Liu F; Liu J; Han H; Han Y
收藏  |  浏览/下载:24/0  |  提交时间:2010/11/15


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