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	Effect of instrumental response time in exponential-decay based cavity ring-down techniques for high reflectivity measurement
	Gong, Y ; Li, BC
	2008
会议名称	PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)
卷号	6720
页码	E7201-E7201
中文摘要	Exponential-decay based cavity ring-down (CRD) techniques, such as the pulsed-CRD and continuous-wave (cw) CRD employing a fast switch to shut down the laser beam, are widely used for high reflectivity measurement. In this paper the influence of the response time of the experimental apparatus on the high reflectivity measurement is investigated theoretically and experimentally. Theoretical expressions taking into account the instrumental response time are given for both pulsed- and cw-CRD techniques, respectively. By establishing a simple cw-CRD setup employing detectors with different response time, the influence of the instrumental response time on the high reflectivity measurement is experimentally investigated. By applying a multi-parameter estimation technique to determine simultaneously the cavity decay time and the overall response time of the experimental apparatus via fitting the experimental CRD signal to the corresponding theoretical model, the influence of a long instrumental response time on the reflectivity determination is eliminated. The reflectivities of the cavity mirror measured with detectors with different rise time are in excellent agreement. On the other hand, the error of high reflectivity measurement increases with the increasing rise/fall time of the apparatus in cases that the CRD signals obtained by detectors with relatively slow rise time are simply treated with a single exponential decay fitting procedure.
收录类别	EI
学科主题	光学薄膜技术
语种	英语
ISSN号	0361-0753
内容类型	会议论文
源URL	[http://ir.ioe.ac.cn/handle/181551/1854]
专题	光电技术研究所_薄膜光学技术研究室（十一室）
推荐引用方式 GB/T 7714	Gong, Y,Li, BC. Effect of instrumental response time in exponential-decay based cavity ring-down techniques for high reflectivity measurement[C]. 见:PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE).

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