A comparative study of CCl4 reactions on Ag and Si surfaces by in situ ultraviolet photoemission electron microscopy | |
Yao, Yunxi; Fu, Qiang; Tan, Dali; Bao, Xinhe | |
刊名 | journal of physics-condensed matter
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2009-08-05 | |
卷号 | 21期号:31 |
英文摘要 | the reactivity of a bulk ag surface, an ag monolayer film on si(111)-7 x 7 (denoted as the root 3 x root 3-ag-si surface), and si(111)-7 x 7 to ccl4 was investigated by x-ray photoelectron spectroscopy (xps) and ultraviolet photoemission electron microscopy (uv-peem). in situ uv-peem was used to monitor simultaneously the ccl4 dissociation on different surface domains, including the bulk ag, root 3 x root 3-ag-si, and si(111). the peem results combined with xps data show that ccl4 adsorbs dissociatively on bulk ag(111) and si(111) but adsorbs molecularly on the root 3 x root 3-ag-si surface, and the surface reactivity follows the order of si(111) > ag(111) > root 3 x root 3-ag-si. |
WOS标题词 | science & technology ; physical sciences |
类目[WOS] | physics, condensed matter |
研究领域[WOS] | physics |
关键词[WOS] | adsorption ; turbulence ; oxidation ; emission ; dynamics ; ag(111) ; metals ; growth |
收录类别 | SCI ; ISTP |
语种 | 英语 |
WOS记录号 | WOS:000267880300015 |
公开日期 | 2015-11-17 |
内容类型 | 期刊论文 |
源URL | [http://159.226.238.44/handle/321008/141505] ![]() |
专题 | 大连化学物理研究所_中国科学院大连化学物理研究所 |
作者单位 | Chinese Acad Sci, State Key Lab Catalysis, Dalian Inst Chem Phys, Dalian 116023, Peoples R China |
推荐引用方式 GB/T 7714 | Yao, Yunxi,Fu, Qiang,Tan, Dali,et al. A comparative study of CCl4 reactions on Ag and Si surfaces by in situ ultraviolet photoemission electron microscopy[J]. journal of physics-condensed matter,2009,21(31). |
APA | Yao, Yunxi,Fu, Qiang,Tan, Dali,&Bao, Xinhe.(2009).A comparative study of CCl4 reactions on Ag and Si surfaces by in situ ultraviolet photoemission electron microscopy.journal of physics-condensed matter,21(31). |
MLA | Yao, Yunxi,et al."A comparative study of CCl4 reactions on Ag and Si surfaces by in situ ultraviolet photoemission electron microscopy".journal of physics-condensed matter 21.31(2009). |
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