Bias dependence of apparent layer thickness and Moire pattern on NaCl/Cu(001)

CORC > 武汉物理与数学研究所 > 中国科学院武汉物理与数学研究所 > 2011年以前论文发表（包括2011年）

	Bias dependence of apparent layer thickness and Moire pattern on NaCl/Cu(001)
	Guo, Qinmin 1,2; Qin, Zhihui 1; Liu, Cunding 1,2; Zang, Kan 1,2; Yu, Yinghui 1; Cao, Gengyu 1
刊名	SURFACE SCIENCE
	2010-09-01
卷号	604 期号:19-20 页码:1820-1824
关键词	NaCl layer Image potential states Moire pattern Scanning tunneling microscopy
产权排序	第一
英文摘要	Bias-dependent features of the insulating NaCl layer grown on Cu(001) have been investigated by scanning tunneling microscopy/spectroscopy (STM/STS). The apparent layer thickness of the NaCl film is variable at bias voltages ranging from 2.8 to 3.2 V as well as from 4.0 to 5.0 V. and the Moire pattern induced by NaCl-Cu lattice mismatch also shows bias dependence. The z-V (dz/dV-V) curves and dl/dV mapping measurements reveal that the resonant tunneling between the image potential states (IPSs) on Cu(001) and the Fermi level of the STM tip leads to drastic variations of these features. Crown Copyright (C) 2010 Published by Elsevier B.V. All rights reserved.
学科主题	原子分子物理学
WOS标题词	Science & Technology ; Physical Sciences
类目[WOS]	Chemistry, Physical ; Physics, Condensed Matter
研究领域[WOS]	Chemistry ; Physics
关键词[WOS]	IMAGE-POTENTIAL STATES ; CHARGE-STATE ; SURFACE ; FILMS ; SPECTROSCOPY ; MICROSCOPY ; SUBSTRATE ; INTERFACE ; CLUSTERS ; STM
收录类别	SCI
语种	英语
WOS记录号	WOS:000281993200044
内容类型	期刊论文
源URL	[http://ir.wipm.ac.cn/handle/112942/2035]
专题	武汉物理与数学研究所_2011年以前论文发表（包括2011年）
作者单位	1.Chinese Acad Sci, Wuhan Inst Phys & Math, State Key Lab Magnet Resonance & Atom & Mol Phys, Wuhan 430071, Peoples R China 2.Chinese Acad Sci, Grad Sch, Beijing 100049, Peoples R China
推荐引用方式 GB/T 7714	Guo, Qinmin,Qin, Zhihui,Liu, Cunding,et al. Bias dependence of apparent layer thickness and Moire pattern on NaCl/Cu(001)[J]. SURFACE SCIENCE,2010,604(19-20):1820-1824.
APA	Guo, Qinmin,Qin, Zhihui,Liu, Cunding,Zang, Kan,Yu, Yinghui,&Cao, Gengyu.(2010).Bias dependence of apparent layer thickness and Moire pattern on NaCl/Cu(001).SURFACE SCIENCE,604(19-20),1820-1824.
MLA	Guo, Qinmin,et al."Bias dependence of apparent layer thickness and Moire pattern on NaCl/Cu(001)".SURFACE SCIENCE 604.19-20(2010):1820-1824.