Negative refraction by a planar Ag/SiO2 multilayer at ultraviolet wavelength to the limit of silver

CORC > 长春光学精密机械与物理研究所 > 中国科学院长春光学精密机械与物理研究所 > 中科院长春光机所知识产出

	Negative refraction by a planar Ag/SiO2 multilayer at ultraviolet wavelength to the limit of silver
	Zhao J. ; Gao J. ; Deng Y. ; Liu H. ; Wang X.
刊名	Aip Advances
	2014
卷号	4 期号:4 页码:7
ISSN号	ISBN/2158-3226
英文摘要	For planar structured hyperbolic metamaterial, the shortest wavelength achievable for negative refraction is often limited by dielectric layers, which are usually wide band gap semiconductors that absorb light strongly at wavelength shorter than their absorption edge. Here we proposed that using SiO2 may break such limitation based on effective medium theory. Through calculation and simulation we demonstrated broad angle negative refraction by a planar Ag/SiO2 layered structure at wavelength down to 326 nm. Its imaging and focusing abilities were also presented. The lower limit of wavelength here is defined by the property of silver, whose permittivity turns positive below 324 nm. (C) 2014 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License.
收录类别	SCI ; EI
语种	英语
内容类型	期刊论文
源URL	[http://ir.ciomp.ac.cn/handle/181722/44187]
专题	长春光学精密机械与物理研究所_中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Zhao J.,Gao J.,Deng Y.,et al. Negative refraction by a planar Ag/SiO2 multilayer at ultraviolet wavelength to the limit of silver[J]. Aip Advances,2014,4(4):7.
APA	Zhao J.,Gao J.,Deng Y.,Liu H.,&Wang X..(2014).Negative refraction by a planar Ag/SiO2 multilayer at ultraviolet wavelength to the limit of silver.Aip Advances,4(4),7.
MLA	Zhao J.,et al."Negative refraction by a planar Ag/SiO2 multilayer at ultraviolet wavelength to the limit of silver".Aip Advances 4.4(2014):7.