Fully Automatic Matching of Circular Markers for Camera Calibration
Xia RB(夏仁波); Zhao JB(赵吉宾); Liu WJ(刘伟军); Xu JT(徐金亭)
2008
会议名称3rd International Conference on Intelligent System and Knowledge Engineering
会议日期November 17-19, 2008
会议地点Xiamen, China
页码1065-1070
中文摘要Camera calibration is one of critical steps in computer vision, also an exhaustive process because substantial human computer interactions are frequently required to deal with the matching problem. In this paper, an automatic matching method of markers for camera calibration is presented based on the local architecture characteristics of a new planar circle pattern, which can be applied to a wide range of spoiled in;ages including those of distortion, noise, and blur. Firstly, a robust ellipse detector is developed to extract ellipses from the image. After the centroids of the ellipses are triangulated into triangle network by Delaunay method to find k annular neighborhood of each ellipse, a cost function is defined to locate orientation ellipses for the homography matrix between the image and the calibration pattern. Then the correspondences between the marker ellipses and the marker circles are established by a homography method followed by a point sets registration strategy. Finally, the method is tested with real and transformed images to show its accuracy and robustness, which is entirely unsupervised and easily embedded into the exiting algorithms
收录类别EI ; CPCI(ISTP)
产权排序1
会议主办者Xiamen Univ, Fuzhou Univ, Fujian Agr & Fore Univ, Jimei Univ, Sanming Univ, Hunan Inst Humanities, Sci & Tech, Longyan Univ, IEEE Beijing Sect, Tsinghua Univ, SW Jiaotong Univ, Donghua Univ Ghent Univ, Belgian Nucl Res Ctr, Univ Technol
会议录2008 3RD INTERNATIONAL CONFERENCE ON INTELLIGENT SYSTEM AND KNOWLEDGE ENGINEERING, VOLS 1 AND 2
会议录出版者IEEE
会议录出版地NEW YORK
语种英语
ISBN号978-1-4244-2196-1
WOS记录号WOS:000262437400200
内容类型会议论文
源URL[http://ir.sia.cn/handle/173321/8238]  
专题沈阳自动化研究所_工业信息学研究室_先进制造技术研究室
推荐引用方式
GB/T 7714
Xia RB,Zhao JB,Liu WJ,et al. Fully Automatic Matching of Circular Markers for Camera Calibration[C]. 见:3rd International Conference on Intelligent System and Knowledge Engineering. Xiamen, China. November 17-19, 2008.
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