Pulsed laser method for SEE testing in FPGAs | |
Jiang, Yu-Guang ; Feng, Guo-Qiang ; Zhu, Xiang ; Shangguan, Shi-Peng ; Ma, Ying-Qi ; Han, Jian-Wei | |
刊名 | Yuanzineng Kexue Jishu/Atomic Energy Science and Technology
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2012 | |
卷号 | 46期号:SUPPL. 1页码:582-586 |
ISSN号 | 1000-6931 |
通讯作者 | 北京8701信箱 |
中文摘要 | The pulsed laser method for studying single event effect (SEE) in Virtex-2 FPGA was discussed, and the validity of laser stimulated SEE was evaluated. The laser focusing depth and laser fluence have important impact on the cross section of device under test. With high pulse energy, a single laser pulse could induce multiple-bit upsets (MBU). During irradiation of pulsed laser, the current of chip is increased by 1-2 mA and the chip works normally. A comparison between the results of heavy ion and pulsed laser shows that pulsed laser is valid to simulate SEE like heavy-ion. |
学科主题 | 空间环境 |
收录类别 | EI |
语种 | 中文 |
公开日期 | 2014-12-15 |
内容类型 | 期刊论文 |
源URL | [http://ir.nssc.ac.cn/handle/122/2859] ![]() |
专题 | 国家空间科学中心_保障部/保障与试验验证中心 |
推荐引用方式 GB/T 7714 | Jiang, Yu-Guang,Feng, Guo-Qiang,Zhu, Xiang,et al. Pulsed laser method for SEE testing in FPGAs[J]. Yuanzineng Kexue Jishu/Atomic Energy Science and Technology,2012,46(SUPPL. 1):582-586. |
APA | Jiang, Yu-Guang,Feng, Guo-Qiang,Zhu, Xiang,Shangguan, Shi-Peng,Ma, Ying-Qi,&Han, Jian-Wei.(2012).Pulsed laser method for SEE testing in FPGAs.Yuanzineng Kexue Jishu/Atomic Energy Science and Technology,46(SUPPL. 1),582-586. |
MLA | Jiang, Yu-Guang,et al."Pulsed laser method for SEE testing in FPGAs".Yuanzineng Kexue Jishu/Atomic Energy Science and Technology 46.SUPPL. 1(2012):582-586. |
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