Pulsed laser method for SEE testing in FPGAs

CORC > 国家空间科学中心 > 中国科学院国家空间科学中心 > 保障部/保障与试验验证中心

	Pulsed laser method for SEE testing in FPGAs
	Jiang, Yu-Guang ; Feng, Guo-Qiang ; Zhu, Xiang ; Shangguan, Shi-Peng ; Ma, Ying-Qi ; Han, Jian-Wei
刊名	Yuanzineng Kexue Jishu/Atomic Energy Science and Technology
	2012
卷号	46 期号:SUPPL. 1 页码:582-586
ISSN号	1000-6931
通讯作者	北京8701信箱
中文摘要	The pulsed laser method for studying single event effect (SEE) in Virtex-2 FPGA was discussed, and the validity of laser stimulated SEE was evaluated. The laser focusing depth and laser fluence have important impact on the cross section of device under test. With high pulse energy, a single laser pulse could induce multiple-bit upsets (MBU). During irradiation of pulsed laser, the current of chip is increased by 1-2 mA and the chip works normally. A comparison between the results of heavy ion and pulsed laser shows that pulsed laser is valid to simulate SEE like heavy-ion.
学科主题	空间环境
收录类别	EI
语种	中文
公开日期	2014-12-15
内容类型	期刊论文
源URL	[http://ir.nssc.ac.cn/handle/122/2859]
专题	国家空间科学中心_保障部/保障与试验验证中心
推荐引用方式 GB/T 7714	Jiang, Yu-Guang,Feng, Guo-Qiang,Zhu, Xiang,et al. Pulsed laser method for SEE testing in FPGAs[J]. Yuanzineng Kexue Jishu/Atomic Energy Science and Technology,2012,46(SUPPL. 1):582-586.
APA	Jiang, Yu-Guang,Feng, Guo-Qiang,Zhu, Xiang,Shangguan, Shi-Peng,Ma, Ying-Qi,&Han, Jian-Wei.(2012).Pulsed laser method for SEE testing in FPGAs.Yuanzineng Kexue Jishu/Atomic Energy Science and Technology,46(SUPPL. 1),582-586.
MLA	Jiang, Yu-Guang,et al."Pulsed laser method for SEE testing in FPGAs".Yuanzineng Kexue Jishu/Atomic Energy Science and Technology 46.SUPPL. 1(2012):582-586.