| Predicting leaf area index in wheat using an improved empirical model | |
| Chen, Hanyue ; Niu, Zheng ; Huang, Wenjiang ; Feng, Jilu | |
| 刊名 | Journal of Applied Remote Sensing
 |
| 2013 | |
| 卷号 | 7期号:24 |
| ISSN号 | 1931-3195 |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2014-12-07 |
| 内容类型 | 期刊论文 |
| 源URL | [http://ir.ceode.ac.cn/handle/183411/28383]  |
| 专题 | 遥感与数字地球研究所_SCI/EI期刊论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Chen, Hanyue,Niu, Zheng,Huang, Wenjiang,et al. Predicting leaf area index in wheat using an improved empirical model[J]. Journal of Applied Remote Sensing,2013,7(24). |
| APA | Chen, Hanyue,Niu, Zheng,Huang, Wenjiang,&Feng, Jilu.(2013).Predicting leaf area index in wheat using an improved empirical model.Journal of Applied Remote Sensing,7(24). |
| MLA | Chen, Hanyue,et al."Predicting leaf area index in wheat using an improved empirical model".Journal of Applied Remote Sensing 7.24(2013). |
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