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Discriminating wheat aphid damage level using spectral correlation simulating analysis
Huang, Wenjiang ; Luo, Juhua ; Guan, Qingsong ; Zhao, Jinling ; Zhang, Jingcheng
2013
会议名称2013 33rd IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2013,
会议日期July 21, 2013 - July 26,2013
会议地点Melbourne, VIC, Australia
关键词Crops Curve fitting Geology Remote sensing
页码3722-3725
收录类别EI
会议录出版者Institute of Electrical and Electronics Engineers Inc.
内容类型会议论文
源URL[http://ir.ceode.ac.cn/handle/183411/31524]  
专题遥感与数字地球研究所_EI会议论文_会议论文
推荐引用方式
GB/T 7714
Huang, Wenjiang,Luo, Juhua,Guan, Qingsong,et al. Discriminating wheat aphid damage level using spectral correlation simulating analysis[C]. 见:2013 33rd IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2013,. Melbourne, VIC, Australia. July 21, 2013 - July 26,2013.
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