Preparation and electrical properties of mn-co-ni-o thin-film for ntc thermistors application
ChenXueying ; WangLei ; XuJinbao ; Bian Liang ; Gao Bo
2013
会议名称Chinese Materials Congress 2012, CMC 2012
会议日期July 13, 2012 - July 18, 2012
会议地点Taiyuan, China
页码599-604
通讯作者Chen, X.(chenxueying_123_2006@126.com)
中文摘要Mn-Co-Ni-O (Mn:Co:Ni=1.74:0.72:0.54, MCN) thin films with single cubic spinel structure were prepared on Si substrates by metal organic solution deposition (MOSD) method at different annealing temperatures. The effects of annealing temperature on the phase component, crystalline microstructure, surface morphology and electrical properties of the MCN thin films were studied. According to the results of x-ray diffraction pattern, the MCN thin film annealed at 650°C had spinel structure. Observation with field emission scanning electron microscope (FE-SEM) on the MCN thin films showed that the grain size increased with increasing annealing temperature. The resistance measured at room-temperature was 18.143, 12.457, 2.435 and 3.141MΩ for the MCN thin films annealed at 650, 700, 750 and 800°C respectively. The values of thermistor constant (B30/85) and activation energy (Ea) were in the range of 3260-4840K and 0.28-0.42eV, respectively.
收录类别EI
会议录出版地Trans Tech Publications Ltd, Kreuzstrasse 10, Zurich-Durnten, CH-8635, Switzerland
语种英语
ISSN号2555476
ISBN号9783037856079
内容类型会议论文
源URL[http://ir.xjipc.cas.cn/handle/365002/3620]  
专题新疆理化技术研究所_材料物理与化学研究室
推荐引用方式
GB/T 7714
ChenXueying,WangLei,XuJinbao,et al. Preparation and electrical properties of mn-co-ni-o thin-film for ntc thermistors application[C]. 见:Chinese Materials Congress 2012, CMC 2012. Taiyuan, China. July 13, 2012 - July 18, 2012.
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