Hard X-ray one dimensional nano-focusing at the SSRF using a WSi2/Si multilayer Laue lens
Huang Qiu-Shi ; Li Hao-Chuan ; Song Zhu-Qing ; Zhu Jing-Tao ; Wang Zhan-Shan ; Li Ai-Guo(李爱国) ; Yan Shuai(闫帅) ; Mao Cheng-Wen(毛成文) ; Wang Hua(王华) ; Yan Fen(闫芬) ; Zhang Ling ; Yu Xiao-Han(余笑寒) ; Liu Peng ; Li Ming
刊名CHINESE PHYSICS C
2013
卷号37期号:2
ISSN号1674-1137
英文摘要The multilayer Laue lens (MLL) is a novel diffraction optics which can realize nanometer focusing of hard X-rays with high efficiency. In this paper, a 7.9 mu m-thick MLL with the outmost layer thickness of 15 nm is designed based on dynamical diffraction theory. The MLL is fabricated by first depositing the depth-graded multilayer using direct current (DC) magnetron sputtering technology. Then, the multilayer sample is sliced, and both cross-sections are thinned and polished to a depth of 35-41 mu m. The focusing property of the MLL is measured at the Shanghai Synchrotron Facility (SSRF). One-dimensional (1D) focusing resolutions of 205 nm and 221 nm are obtained at E=14 keV and 18 keV, respectively. It demonstrates that the fabricated MLL can focus hard X-rays into nanometer scale.
收录类别SCI
语种英语
WOS记录号WOS:000320547600018
公开日期2014-06-13
内容类型期刊论文
源URL[http://ir.sinap.ac.cn/handle/331007/13764]  
专题上海应用物理研究所_中科院上海应用物理研究所2011-2017年
推荐引用方式
GB/T 7714
Huang Qiu-Shi,Li Hao-Chuan,Song Zhu-Qing,et al. Hard X-ray one dimensional nano-focusing at the SSRF using a WSi2/Si multilayer Laue lens[J]. CHINESE PHYSICS C,2013,37(2).
APA Huang Qiu-Shi.,Li Hao-Chuan.,Song Zhu-Qing.,Zhu Jing-Tao.,Wang Zhan-Shan.,...&Li Ming.(2013).Hard X-ray one dimensional nano-focusing at the SSRF using a WSi2/Si multilayer Laue lens.CHINESE PHYSICS C,37(2).
MLA Huang Qiu-Shi,et al."Hard X-ray one dimensional nano-focusing at the SSRF using a WSi2/Si multilayer Laue lens".CHINESE PHYSICS C 37.2(2013).
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