Mechanisms in the saturation behavior for low voltage cathodoluminescence

	Mechanisms in the saturation behavior for low voltage cathodoluminescence
	Shang CY ; Wang XQ ; Cheng ZY ; Hou ZY ; Lin J
刊名	journal of applied physics
	2013
卷号	113 期号:9
关键词	FIELD-EMISSION DISPLAYS PHOSPHORS PHOTOLUMINESCENCE SILICA
ISSN号	0021-8979
通讯作者	shang cy
中文摘要	the saturation behavior in exciting power p-excite is the specific characteristic in low voltage cathodoluminescence due to the high resistivity of the phosphor, causing the saturation behavior in field emission display. with the increasing of current density j, the saturation behavior in p-excite directly results in the saturation of electron-hole (e-h) generation rate g(num). the e-h generation region x would shrink, resulting in the drastic increase of e-h concentration generation rate g(con), causing the decrease in probability eta(et) of an e-h pair exciting an activator. in addition, the radiative transition probability eta(rad) of an excited activator would be decreased due to the shrinkage of x and increase of temperature. to restrain the saturation behavior in low voltage cathodoluminescence, the ultimate method is to lower the resistivity of the phosphor. by introducing in2o3 conductive component into y2o3:eu3+ phosphor, restrained saturation behavior in cathodoluminescence of y2o3: eu3+ phosphor was effectively achieved. (c) 2013 american institute of physics. [http://dx.doi.org/10.1063/1.4793490]
收录类别	SCI收录期刊论文
语种	英语
WOS记录号	WOS:000316086500001
公开日期	2014-04-16
内容类型	期刊论文
源URL	[http://ir.ciac.jl.cn/handle/322003/49986]
专题	长春应用化学研究所_长春应用化学研究所知识产出_期刊论文
推荐引用方式 GB/T 7714	Shang CY,Wang XQ,Cheng ZY,et al. Mechanisms in the saturation behavior for low voltage cathodoluminescence[J]. journal of applied physics,2013,113(9).
APA	Shang CY,Wang XQ,Cheng ZY,Hou ZY,&Lin J.(2013).Mechanisms in the saturation behavior for low voltage cathodoluminescence.journal of applied physics,113(9).
MLA	Shang CY,et al."Mechanisms in the saturation behavior for low voltage cathodoluminescence".journal of applied physics 113.9(2013).