The numerical-aperture-dependent optical contrast and thickness determination of ultrathin flakes of two-dimensional atomic crystals: A case of graphene multilayers

	The numerical-aperture-dependent optical contrast and thickness determination of ultrathin flakes of two-dimensional atomic crystals: A case of graphene multilayers
	Han Wen-Peng, Shi Yan-Meng, Li Xiao-Li, Luo Shi-Qiang, Lu Yan, Tan Ping-Heng
刊名	acta physica sinica
	2013
卷号	62 期号:11 页码:110702
学科主题	半导体物理
收录类别	SCI
语种	英语
公开日期	2014-03-26
内容类型	期刊论文
源URL	[http://ir.semi.ac.cn/handle/172111/24586]
专题	半导体研究所_半导体超晶格国家重点实验室
推荐引用方式 GB/T 7714	Han Wen-Peng, Shi Yan-Meng, Li Xiao-Li, Luo Shi-Qiang, Lu Yan, Tan Ping-Heng. The numerical-aperture-dependent optical contrast and thickness determination of ultrathin flakes of two-dimensional atomic crystals: A case of graphene multilayers[J]. acta physica sinica,2013,62(11):110702.
APA	Han Wen-Peng, Shi Yan-Meng, Li Xiao-Li, Luo Shi-Qiang, Lu Yan, Tan Ping-Heng.(2013).The numerical-aperture-dependent optical contrast and thickness determination of ultrathin flakes of two-dimensional atomic crystals: A case of graphene multilayers.acta physica sinica,62(11),110702.
MLA	Han Wen-Peng, Shi Yan-Meng, Li Xiao-Li, Luo Shi-Qiang, Lu Yan, Tan Ping-Heng."The numerical-aperture-dependent optical contrast and thickness determination of ultrathin flakes of two-dimensional atomic crystals: A case of graphene multilayers".acta physica sinica 62.11(2013):110702.