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Piezoresponse Force Microscopy Study of Ferroelectric BaTiO3 Thin Film Directly Deposited on Si(001) by Magnetron Sputtering
Lu, HL ; Song, SQ ; Gu, XF ; He, SL ; Chen, CL ; Song, GB ; Cai, ZH ; Guo, HM ; Gao, HJ ; Sun, L
刊名JOURNAL OF NANO RESEARCH
2013
卷号22页码:23
关键词Ferroelectric Thin Film BaTiO3 Magnetron Sputtering
ISSN号1662-5250
通讯作者Lu, HL (reprint author), Univ Houston, Dept Mech Engn, Houston, TX 77204 USA.
中文摘要Direct integration of ferroelectrics with semiconductors is critical to lower the cost and simplify the production procedures for data storage/processing components and miniature sensor/actuator development. By optimizing magnetron sputtering parameters, highly <001> preferential growth of BaTiO3 thin films with reproducible ferroelectric responses have been achieved on Si(001) substrates. The thin film ferroelectric characteristics were systematically studied by piezoresponse force microscopy, and a piezoelectric coefficient d(33) of 24pm/V has been measured. It is found that the scanning tip sidewall angle and cantilever tilt affect the contour and size of polarized area.
资助信息DOD TATRC award through the Alliance for Nano Health [W81XWH-09-2-0139]; 111 Project [B12018]; PAPD of Jiangsu Higher Education Institutions; U.S. Department of Energy Sciences, Office of Science [W-31-109-ENG-38]
语种英语
公开日期2014-01-16
内容类型期刊论文
源URL[http://ir.iphy.ac.cn/handle/311004/57340]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Lu, HL,Song, SQ,Gu, XF,et al. Piezoresponse Force Microscopy Study of Ferroelectric BaTiO3 Thin Film Directly Deposited on Si(001) by Magnetron Sputtering[J]. JOURNAL OF NANO RESEARCH,2013,22:23.
APA Lu, HL.,Song, SQ.,Gu, XF.,He, SL.,Chen, CL.,...&Sun, L.(2013).Piezoresponse Force Microscopy Study of Ferroelectric BaTiO3 Thin Film Directly Deposited on Si(001) by Magnetron Sputtering.JOURNAL OF NANO RESEARCH,22,23.
MLA Lu, HL,et al."Piezoresponse Force Microscopy Study of Ferroelectric BaTiO3 Thin Film Directly Deposited on Si(001) by Magnetron Sputtering".JOURNAL OF NANO RESEARCH 22(2013):23.
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