Note: A simple approach to fabricate a microscopic four-point probe for conductivity measurements in ultrahigh vacuum | |
Pang, F ; Liang, XJ ; Chen, DM | |
刊名 | REVIEW OF SCIENTIFIC INSTRUMENTS
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2013 | |
卷号 | 84期号:7 |
ISSN号 | 0034-6748 |
通讯作者 | Pang, F (reprint author), Renmin Univ China, Dept Phys, Beijing 100872, Peoples R China. |
中文摘要 | We present a simple method to fabricate microscopic four-point probe (M4PP) with spacing of 70-100 mu m for conductivity measurements in ultrahigh vacuum. The probe includes four gold wires with 30 mu m diameter and a 0.5 mm thickness sapphire slice as cantilever. One of the dual scanning tunneling microscope (DSTM) is replaced by M4PP. As a result, in situ transport measurement could be performed by M4PP and investigation of surface morphology by STM. Finally, we measure conductivity of 14 monolayer Bi(111) epitaxial film on n type Si which is 1.6 x 10(-3) Omega(-1)/square. c 2013 AIP Publishing LLC. |
资助信息 | National Natural Science Foundation of China [10874217, 10427402] |
语种 | 英语 |
公开日期 | 2014-01-16 |
内容类型 | 期刊论文 |
源URL | [http://ir.iphy.ac.cn/handle/311004/57264] ![]() |
专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
推荐引用方式 GB/T 7714 | Pang, F,Liang, XJ,Chen, DM. Note: A simple approach to fabricate a microscopic four-point probe for conductivity measurements in ultrahigh vacuum[J]. REVIEW OF SCIENTIFIC INSTRUMENTS,2013,84(7). |
APA | Pang, F,Liang, XJ,&Chen, DM.(2013).Note: A simple approach to fabricate a microscopic four-point probe for conductivity measurements in ultrahigh vacuum.REVIEW OF SCIENTIFIC INSTRUMENTS,84(7). |
MLA | Pang, F,et al."Note: A simple approach to fabricate a microscopic four-point probe for conductivity measurements in ultrahigh vacuum".REVIEW OF SCIENTIFIC INSTRUMENTS 84.7(2013). |
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