Note: A simple approach to fabricate a microscopic four-point probe for conductivity measurements in ultrahigh vacuum

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	Note: A simple approach to fabricate a microscopic four-point probe for conductivity measurements in ultrahigh vacuum
	Pang, F ; Liang, XJ ; Chen, DM
刊名	REVIEW OF SCIENTIFIC INSTRUMENTS
	2013
卷号	84 期号:7
ISSN号	0034-6748
通讯作者	Pang, F (reprint author), Renmin Univ China, Dept Phys, Beijing 100872, Peoples R China.
中文摘要	We present a simple method to fabricate microscopic four-point probe (M4PP) with spacing of 70-100 mu m for conductivity measurements in ultrahigh vacuum. The probe includes four gold wires with 30 mu m diameter and a 0.5 mm thickness sapphire slice as cantilever. One of the dual scanning tunneling microscope (DSTM) is replaced by M4PP. As a result, in situ transport measurement could be performed by M4PP and investigation of surface morphology by STM. Finally, we measure conductivity of 14 monolayer Bi(111) epitaxial film on n type Si which is 1.6 x 10(-3) Omega(-1)/square. c 2013 AIP Publishing LLC.
资助信息	National Natural Science Foundation of China [10874217, 10427402]
语种	英语
公开日期	2014-01-16
内容类型	期刊论文
源URL	[http://ir.iphy.ac.cn/handle/311004/57264]
专题	物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式 GB/T 7714	Pang, F,Liang, XJ,Chen, DM. Note: A simple approach to fabricate a microscopic four-point probe for conductivity measurements in ultrahigh vacuum[J]. REVIEW OF SCIENTIFIC INSTRUMENTS,2013,84(7).
APA	Pang, F,Liang, XJ,&Chen, DM.(2013).Note: A simple approach to fabricate a microscopic four-point probe for conductivity measurements in ultrahigh vacuum.REVIEW OF SCIENTIFIC INSTRUMENTS,84(7).
MLA	Pang, F,et al."Note: A simple approach to fabricate a microscopic four-point probe for conductivity measurements in ultrahigh vacuum".REVIEW OF SCIENTIFIC INSTRUMENTS 84.7(2013).