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STRUCTURAL FEATURES OF THE INCOMMENSURATE MODULATION IN THE PB-DOPED BI-2223 HIGH-TC PHASE REVEALED BY DIRECT-METHOD ELECTRON-DIFFRACTION ANALYSIS
MO, YD ; CHENG, TZ ; Fan, HF ; LI, JQ ; SHA, BD ; ZHENG, CD ; LI, FH ; ZHAO, ZX
刊名SUPERCONDUCTOR SCIENCE & TECHNOLOGY
1992
卷号5期号:2页码:69
关键词CRYSTAL-STRUCTURES SUPERSPACE
ISSN号0953-2048
通讯作者MO, YD (reprint author), CHINESE ACAD SCI,INST PHYS,BEIJING 100080,PEOPLES R CHINA.
中文摘要Structural modulation waves in the Pb-doped Bi-2223 (Bi2Sr2Ca2Cu3Ox) phase are observed for the first time on the potential distribution function projected along the a axis. The newly developed multidimensional direct methods were used. Unlike the previous techniques, there is no need to assume any modulation model before the modulation waves can be seen directly from the resulting Fourier map. The symmetry of the title compound belongs to the four-dimensional space group P111BAR(Bbmb) with three-dimensional unit cell parameters a = 5.49 angstrom, b = 5.41 angstrom, c = 37.1 angstrom, alpha = beta = gamma = 90-degrees and the modulation wavevector q = 0.117b*. Occupational and positional modulations are obvious for most atoms. Disordered oxygen atoms arranged perpendicular to the b axis bridging the Cu(2)-Ca-Cu(1)-Ca-Cu(2) layers were observed.
收录类别SCI
语种英语
公开日期2013-09-24
内容类型期刊论文
源URL[http://ir.iphy.ac.cn/handle/311004/53308]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
MO, YD,CHENG, TZ,Fan, HF,et al. STRUCTURAL FEATURES OF THE INCOMMENSURATE MODULATION IN THE PB-DOPED BI-2223 HIGH-TC PHASE REVEALED BY DIRECT-METHOD ELECTRON-DIFFRACTION ANALYSIS[J]. SUPERCONDUCTOR SCIENCE & TECHNOLOGY,1992,5(2):69.
APA MO, YD.,CHENG, TZ.,Fan, HF.,LI, JQ.,SHA, BD.,...&ZHAO, ZX.(1992).STRUCTURAL FEATURES OF THE INCOMMENSURATE MODULATION IN THE PB-DOPED BI-2223 HIGH-TC PHASE REVEALED BY DIRECT-METHOD ELECTRON-DIFFRACTION ANALYSIS.SUPERCONDUCTOR SCIENCE & TECHNOLOGY,5(2),69.
MLA MO, YD,et al."STRUCTURAL FEATURES OF THE INCOMMENSURATE MODULATION IN THE PB-DOPED BI-2223 HIGH-TC PHASE REVEALED BY DIRECT-METHOD ELECTRON-DIFFRACTION ANALYSIS".SUPERCONDUCTOR SCIENCE & TECHNOLOGY 5.2(1992):69.
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