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Quantum stability and reentrant bilayer-by-bilayer growth of atomically smooth Pb films on semiconductor substrates
Ozer, MM ; Jia, Y ; Wu, B ; Zhang, ZY ; Weitering, HH
刊名PHYSICAL REVIEW B
2005
卷号72期号:11
关键词CHARGE DENSITY SURFACES ISLANDS ENERGY WAVE
ISSN号1098-0121
通讯作者Ozer, MM (reprint author), Univ Tennessee, Dept Phys & Astron, Knoxville, TN 37996 USA.
中文摘要Single crystals of thallium-based cuprates with the general formula Tl2Ba2Can-1CunOx (n=1,2,3) have been grown by the flux method. The superconducting transition temperatures determined by the ac magnetic susceptibility are 92, 109, and 119 K for n=1,2,3, respectively. X-ray diffraction measurements and an EDX compositional analysis were described. We measured in-plane optical reflectance from room temperature down to 10 K, placing an emphasis on Tl-2223. The reflectance roughly has a linear-frequency dependence above the superconducting transition temperature, but displays a pronounced knee structure together with a diplike feature at higher frequency below T-c. Correspondingly, the ratio of the reflectances below and above T-c displays a maximum and a minimum near those feature frequencies. In particular, those features in Tl2223 appear at a higher-energy scale than Tl2212 and Tl2201. The optical data are analyzed in terms of the spectral function. We discussed the physical consequences of the data in terms of both clean and dirty limits.
收录类别SCI
语种英语
公开日期2013-09-24
内容类型期刊论文
源URL[http://ir.iphy.ac.cn/handle/311004/51746]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Ozer, MM,Jia, Y,Wu, B,et al. Quantum stability and reentrant bilayer-by-bilayer growth of atomically smooth Pb films on semiconductor substrates[J]. PHYSICAL REVIEW B,2005,72(11).
APA Ozer, MM,Jia, Y,Wu, B,Zhang, ZY,&Weitering, HH.(2005).Quantum stability and reentrant bilayer-by-bilayer growth of atomically smooth Pb films on semiconductor substrates.PHYSICAL REVIEW B,72(11).
MLA Ozer, MM,et al."Quantum stability and reentrant bilayer-by-bilayer growth of atomically smooth Pb films on semiconductor substrates".PHYSICAL REVIEW B 72.11(2005).
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