Quantum stability and reentrant bilayer-by-bilayer growth of atomically smooth Pb films on semiconductor substrates | |
Ozer, MM ; Jia, Y ; Wu, B ; Zhang, ZY ; Weitering, HH | |
刊名 | PHYSICAL REVIEW B
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2005 | |
卷号 | 72期号:11 |
关键词 | CHARGE DENSITY SURFACES ISLANDS ENERGY WAVE |
ISSN号 | 1098-0121 |
通讯作者 | Ozer, MM (reprint author), Univ Tennessee, Dept Phys & Astron, Knoxville, TN 37996 USA. |
中文摘要 | Single crystals of thallium-based cuprates with the general formula Tl2Ba2Can-1CunOx (n=1,2,3) have been grown by the flux method. The superconducting transition temperatures determined by the ac magnetic susceptibility are 92, 109, and 119 K for n=1,2,3, respectively. X-ray diffraction measurements and an EDX compositional analysis were described. We measured in-plane optical reflectance from room temperature down to 10 K, placing an emphasis on Tl-2223. The reflectance roughly has a linear-frequency dependence above the superconducting transition temperature, but displays a pronounced knee structure together with a diplike feature at higher frequency below T-c. Correspondingly, the ratio of the reflectances below and above T-c displays a maximum and a minimum near those feature frequencies. In particular, those features in Tl2223 appear at a higher-energy scale than Tl2212 and Tl2201. The optical data are analyzed in terms of the spectral function. We discussed the physical consequences of the data in terms of both clean and dirty limits. |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2013-09-24 |
内容类型 | 期刊论文 |
源URL | [http://ir.iphy.ac.cn/handle/311004/51746] ![]() |
专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
推荐引用方式 GB/T 7714 | Ozer, MM,Jia, Y,Wu, B,et al. Quantum stability and reentrant bilayer-by-bilayer growth of atomically smooth Pb films on semiconductor substrates[J]. PHYSICAL REVIEW B,2005,72(11). |
APA | Ozer, MM,Jia, Y,Wu, B,Zhang, ZY,&Weitering, HH.(2005).Quantum stability and reentrant bilayer-by-bilayer growth of atomically smooth Pb films on semiconductor substrates.PHYSICAL REVIEW B,72(11). |
MLA | Ozer, MM,et al."Quantum stability and reentrant bilayer-by-bilayer growth of atomically smooth Pb films on semiconductor substrates".PHYSICAL REVIEW B 72.11(2005). |
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