X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers

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	X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers
	Luo, GM ; Mai, ZH ; Hase, TPA ; Fulthorpe, BD ; Tanner, BK ; Marrows, CH ; Hickey, BJ
刊名	JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
	2001
卷号	226 页码:1728
关键词	DIFFRACTION
ISSN号	0304-8853
通讯作者	Hase, TPA (reprint author), Univ Durham, Dept Phys, South Rd, Durham DH1 3LE, England.
中文摘要	We report the application of reflection anomalous fine structure analysis to the study of the changes in the layer density and local environment in sputtered permalloy/copper multilayers. By fitting the smoothly varying component of the plot of multilayer Bragg peak intensity versus incident X-ray energy, we find a strained permalloy layer at the permalloy/copper but not the copper/permalloy interface. The density difference between copper and strained permalloy layers increases on annealing at 275 degreesC and from the oscillatory component of the spectrum, we show that it is the nearest-neighbour distance around the Ni atoms which decreases. (C) 2001 Elsevier Science B.V. All rights reserved.
收录类别	SCI
语种	英语
公开日期	2013-09-23
内容类型	期刊论文
源URL	[http://ir.iphy.ac.cn/handle/311004/46709]
专题	物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式 GB/T 7714	Luo, GM,Mai, ZH,Hase, TPA,et al. X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers[J]. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS,2001,226:1728.
APA	Luo, GM.,Mai, ZH.,Hase, TPA.,Fulthorpe, BD.,Tanner, BK.,...&Hickey, BJ.(2001).X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers.JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS,226,1728.
MLA	Luo, GM,et al."X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers".JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS 226(2001):1728.