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Variable wavelength grazing incidence x-ray reflectivity measurements of structural changes on annealing Cu/NiFe multilayers
Luo, GM ; Mai, ZH ; Hase, TPA ; Fulthorpe, BD ; Tanner, BK ; Marrows, CH ; Hickey, BJ
刊名PHYSICAL REVIEW B
2001
卷号64期号:24
关键词ANOMALOUS FINE-STRUCTURE GIANT MAGNETORESISTANCE PERMALLOY/COPPER MULTILAYERS THIN-FILMS
ISSN号1098-0121
通讯作者Luo, GM (reprint author), Chinese Acad Sci, Inst Phys, POB 603, Beijing 100080, Peoples R China.
中文摘要Grazing incidence x-ray reflectivity spectra from copper/permalloy multilayers have been recorded as a function of incident x-ray energy under conditions of fixed scattering vector. From the smoothly varying part of the spectrum, it is possible separately to determine the density and composition as the energy is scanned through the K edges of the constituent elements. From the fit to model layer structures, we determine that there exists a strained layer of permalloy at the permalloy/copper interface that relaxes towards the unstrained density of permalloy on annealing. No such layer exists at the copper/permalloy interface. Cobalt doping results in the formation of a layer of mixed CoNiFe composition, rather than a single Co layer. Oscillations in the spectra above the absorption edges are analyzed in a similar manner to that for diffraction anomalous fine structure and enable the short range order within the layers to be determined. No changes are observed in the Cu or Co environments, but a reduction in the in-plane first shell distance around the Ni atoms is found on annealing.
收录类别SCI
语种英语
公开日期2013-09-23
内容类型期刊论文
源URL[http://ir.iphy.ac.cn/handle/311004/46502]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Luo, GM,Mai, ZH,Hase, TPA,et al. Variable wavelength grazing incidence x-ray reflectivity measurements of structural changes on annealing Cu/NiFe multilayers[J]. PHYSICAL REVIEW B,2001,64(24).
APA Luo, GM.,Mai, ZH.,Hase, TPA.,Fulthorpe, BD.,Tanner, BK.,...&Hickey, BJ.(2001).Variable wavelength grazing incidence x-ray reflectivity measurements of structural changes on annealing Cu/NiFe multilayers.PHYSICAL REVIEW B,64(24).
MLA Luo, GM,et al."Variable wavelength grazing incidence x-ray reflectivity measurements of structural changes on annealing Cu/NiFe multilayers".PHYSICAL REVIEW B 64.24(2001).
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