The relationship of the critical current density and the lattice deformation in Y1-xRExBa2Cu3O7-delta epitaxial films

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	The relationship of the critical current density and the lattice deformation in Y1-xRExBa2Cu3O7-delta epitaxial films
	Peng, ZS ; Hao, JM ; Yin, B ; Zhao, ZX ; Hua, ZQ ; Yang, BC
刊名	PHYSICA C
	1997
卷号	282 页码:2103
关键词	SUPERCONDUCTORS
ISSN号	0921-4534
通讯作者	Peng, ZS (reprint author), TSING HUA UNIV,INST NUCL ENERGY TECHNOL,BEIJING 100084,PEOPLES R CHINA.
中文摘要	The critical current densities Jc of Y1-xRExBa2Cu3O7-delta (RE=Ho, Dy and Eu) epitaxial thin films with x=0,0.2,0.4,0.7,1.0 at various temperatures and magnetic fields have been measured magnetically. XRD results showed that the more serious the lattice deformation, the higher the Jc of the films becomes, have been observed by the width of the X-ray reflections. These results demonstrated the stress field pinning induced by the lattice deformation in RE-doped Y1-xRExBa2Cu3O7-delta epitaxial thin films.
收录类别	SCI
语种	英语
公开日期	2013-09-23
内容类型	期刊论文
源URL	[http://ir.iphy.ac.cn/handle/311004/45442]
专题	物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式 GB/T 7714	Peng, ZS,Hao, JM,Yin, B,et al. The relationship of the critical current density and the lattice deformation in Y1-xRExBa2Cu3O7-delta epitaxial films[J]. PHYSICA C,1997,282:2103.
APA	Peng, ZS,Hao, JM,Yin, B,Zhao, ZX,Hua, ZQ,&Yang, BC.(1997).The relationship of the critical current density and the lattice deformation in Y1-xRExBa2Cu3O7-delta epitaxial films.PHYSICA C,282,2103.
MLA	Peng, ZS,et al."The relationship of the critical current density and the lattice deformation in Y1-xRExBa2Cu3O7-delta epitaxial films".PHYSICA C 282(1997):2103.