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Microwave absorption of YBa2Cu3O thin film
Ong, CK ; Han, GC ; Chen, LF ; Xu, SY ; Zhou, YL
刊名SUPERCONDUCTOR SCIENCE & TECHNOLOGY
1997
卷号10期号:9页码:646
关键词HIGH-TC SUPERCONDUCTORS FREQUENCY VORTEX DYNAMICS RF SURFACE IMPEDANCE FLUX CREEP DISSIPATION TEMPERATURE DEPENDENCE RESISTANCE MODEL
ISSN号0953-2048
中文摘要The microwave surface resistance R-s of YBa2Cu3O thin film on LaAlO2 has been measured as a function of temperature and magnetic field through a resonant cavity technique. At zero field, the temperature dependence of R-s shows a BCS-like variation at higher temperatures and then tends to level off at lower temperatures. A general linear and square-root field dependence of R-s at low and high fields, respectively, has been obtained for both flux flow and pinning dominant regions based on the flux motion theory. The cross-over field H* from linear to square-root R-s(H) dependence was found to be very different for these two regions, In the flux flow region, H* linearly depends on the microwave frequency, white it is independent of the frequency in the flux pinning region. The experimental results for R-s(H) at about 10 GHz show a linear relationship at high temperatures and a transition from linearity to nonlinearity al low temperatures. The temperature dependence of the slope of the linear R-s(H) has been derived and can be well accounted for in terms of the flux flow model. The anisotropy of R-s(H) was measured in different magnetic and electrical field orientations. The results can be qualitatively expressed in terms of the flux motion theory.
收录类别SCI
语种英语
公开日期2013-09-18
内容类型期刊论文
源URL[http://ir.iphy.ac.cn/handle/311004/42154]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Ong, CK,Han, GC,Chen, LF,et al. Microwave absorption of YBa2Cu3O thin film[J]. SUPERCONDUCTOR SCIENCE & TECHNOLOGY,1997,10(9):646.
APA Ong, CK,Han, GC,Chen, LF,Xu, SY,&Zhou, YL.(1997).Microwave absorption of YBa2Cu3O thin film.SUPERCONDUCTOR SCIENCE & TECHNOLOGY,10(9),646.
MLA Ong, CK,et al."Microwave absorption of YBa2Cu3O thin film".SUPERCONDUCTOR SCIENCE & TECHNOLOGY 10.9(1997):646.
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