Magnetic force microscopy study on amorphous TbFe thin films

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	Magnetic force microscopy study on amorphous TbFe thin films
	Sun, ZG ; Zhu, T ; Zhang, ZR ; Shen, BG ; Han, BS ; Shih, JC ; Chin, TS
刊名	JOURNAL OF APPLIED PHYSICS
	2003
卷号	93 期号:10 页码:8534
关键词	QUANTITATIVE-DETERMINATION
ISSN号	0021-8979
通讯作者	Sun, ZG: Chinese Acad Sci, Inst Phys, State Key Lab Magnetism, POB 603, Beijing 100080, Peoples R China.
中文摘要	By using magnetic force microscope (MFM), honeycomb domain structures were found in the as-deposited amorphous TbFe thin films with perpendicular magnetic anisotropy. The domain structures were composed of many small white round dots embedded in the black matrix, which formed an irregular hexagonal pattern with some deformation. MFM measurements were performed with various scanning heights and opposite tip magnetization directions. The z component of both the magnetization and the stray field of the dots were determined quantitatively within the point probe approximation. Charge contrast and susceptibility contrast were separated by forming the difference and sum of two images with opposite tip magnetization. (C) 2003 American Institute of Physics.
收录类别	SCI
语种	英语
公开日期	2013-09-18
内容类型	期刊论文
源URL	[http://ir.iphy.ac.cn/handle/311004/41228]
专题	物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式 GB/T 7714	Sun, ZG,Zhu, T,Zhang, ZR,et al. Magnetic force microscopy study on amorphous TbFe thin films[J]. JOURNAL OF APPLIED PHYSICS,2003,93(10):8534.
APA	Sun, ZG.,Zhu, T.,Zhang, ZR.,Shen, BG.,Han, BS.,...&Chin, TS.(2003).Magnetic force microscopy study on amorphous TbFe thin films.JOURNAL OF APPLIED PHYSICS,93(10),8534.
MLA	Sun, ZG,et al."Magnetic force microscopy study on amorphous TbFe thin films".JOURNAL OF APPLIED PHYSICS 93.10(2003):8534.