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Lamellar structure and twist boundary of NaV2O5 grown by flux method
Wang, YG ; Wu, HY ; Dravid, VP
刊名JOURNAL OF MATERIALS SCIENCE
2005
卷号40期号:7页码:1725
关键词BEAM ELECTRON-DIFFRACTION CRYSTAL-STRUCTURE ALPHA'-NAV2O5 HYPOVANADATES REFINEMENT SYMMETRY
ISSN号0022-2461
通讯作者Wang, YG: Chinese Acad Sci, Inst Phys, Natl Lab Condensed Matter Phys, POB 2724, Beijing 100080, Peoples R China.
中文摘要Microstructures of NaV2O5 prepared using flux method were characterized. These structures were observed to be dominated by lamellae with an average thickness of similar to 1 micron. These lamellae share (001) plane and stack along [001] direction. A small orientation difference among these lamellae was detected with electron diffraction to be within several degrees. A pure twist boundary with (001) plane as the boundary interface and high sigma value of 235 was determined. Within the lamellae there are numerous dislocations arranged parallel to the twist boundary. The twist boundaries and dislocations may introduce distortion in the layers of VO5 pyramids, which is believed to be unfavorable for Na atoms to position between these layers and may result in non-stoichiometry locally at the boundary. (C) 2005 Springer Science + Business Media, Inc.
收录类别SCI
语种英语
公开日期2013-09-18
内容类型期刊论文
源URL[http://ir.iphy.ac.cn/handle/311004/40555]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Wang, YG,Wu, HY,Dravid, VP. Lamellar structure and twist boundary of NaV2O5 grown by flux method[J]. JOURNAL OF MATERIALS SCIENCE,2005,40(7):1725.
APA Wang, YG,Wu, HY,&Dravid, VP.(2005).Lamellar structure and twist boundary of NaV2O5 grown by flux method.JOURNAL OF MATERIALS SCIENCE,40(7),1725.
MLA Wang, YG,et al."Lamellar structure and twist boundary of NaV2O5 grown by flux method".JOURNAL OF MATERIALS SCIENCE 40.7(2005):1725.
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