Image Deconvolution-An Effective Tool of Crystal Structure and Defect Determination in High-Resolution Electron Microscopy

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	Image Deconvolution-An Effective Tool of Crystal Structure and Defect Determination in High-Resolution Electron Microscopy
	Li, FH ; Tang, CY
刊名	ELECTRON CRYSTALLOGRAPHY FOR MATERIALS RESEARCH AND QUANTITATIVE CHARACTERIZATION OF NANOSTRUCTURED MATERIALS
	2009
卷号	1184 页码:61
关键词	ATOMIC CONFIGURATION LOMER DISLOCATION CORE STRUCTURE HREM BOUNDARIES
ISSN号	0272-9172
通讯作者	Li, FH: Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, POB 603, Beijing 100190, Peoples R China.
中文摘要	Image deconvolution is introduced as an effective tool to enhance the determination of crystal structures and defects in high-resolution electron microscopy. The essence is to transform a single image that does not intuitively represent the examined crystal structure into the structure image. The principle and method of image deconvolution together with the related image contrast theory, the pseudo weak phase object approximation (pseudo WPOA), are briefly described. The method has been applied to different types of dislocations, twin boundaries, stacking faults, and one-dimensional incommensurate modulated structures. Results on the semiconducting epilayers Si(0.76)Ge(0.24)/Si and 3C-SiC/Si are given in some detail. The results on other compounds including AlSb/GaAs, GaN, Y(0.6)Na(0.4)Ba(2)Cu(2.7)Zn(0.3)O(7-delta), Ca(0.28)Ba(0.72)Nb(2)O(6) and Bi(2.31)Sr(1.69)CuO(6+delta) are briefly summarized. It is also shown how to recognize atoms of Si from C based on the pseudo WPOA, when the defect structures in SiC was determined at the atomic level with a 200 kV LaB(6) microscope.
收录类别	SCI
语种	英语
公开日期	2013-09-17
内容类型	期刊论文
源URL	[http://ir.iphy.ac.cn/handle/311004/39602]
专题	物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式 GB/T 7714	Li, FH,Tang, CY. Image Deconvolution-An Effective Tool of Crystal Structure and Defect Determination in High-Resolution Electron Microscopy[J]. ELECTRON CRYSTALLOGRAPHY FOR MATERIALS RESEARCH AND QUANTITATIVE CHARACTERIZATION OF NANOSTRUCTURED MATERIALS,2009,1184:61.
APA	Li, FH,&Tang, CY.(2009).Image Deconvolution-An Effective Tool of Crystal Structure and Defect Determination in High-Resolution Electron Microscopy.ELECTRON CRYSTALLOGRAPHY FOR MATERIALS RESEARCH AND QUANTITATIVE CHARACTERIZATION OF NANOSTRUCTURED MATERIALS,1184,61.
MLA	Li, FH,et al."Image Deconvolution-An Effective Tool of Crystal Structure and Defect Determination in High-Resolution Electron Microscopy".ELECTRON CRYSTALLOGRAPHY FOR MATERIALS RESEARCH AND QUANTITATIVE CHARACTERIZATION OF NANOSTRUCTURED MATERIALS 1184(2009):61.