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High-field response and direct identification of metallic and semiconducting multiwalled carbon nanotubes
Liang, XL ; Peng, LM ; Chen, Q ; Che, RC ; Xia, Y ; Xue, ZQ ; Wu, QD
刊名PHYSICAL REVIEW B
2003
卷号68期号:7
关键词ELECTRICAL BREAKDOWN ROOM-TEMPERATURE SINGLE TRANSISTORS CIRCUITS
ISSN号1098-0121
通讯作者Peng, LM: Peking Univ, Dept Elect, Beijing 100871, Peoples R China.
中文摘要The current through a multiwalled carbon nanotube (MWCNT) was measured as a function of time at high bias (>3 Volts), and the current curve was found to show both up and down steps. The phenomenon was explained as resulting from current induced shell-by-shell break down of the MWCNT following Collins [Science 292, 706 (2001)], and the nature of the outmost shell of the MWCNT was directly identified by monitoring the current curve.
收录类别SCI
语种英语
公开日期2013-09-17
内容类型期刊论文
源URL[http://ir.iphy.ac.cn/handle/311004/39306]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Liang, XL,Peng, LM,Chen, Q,et al. High-field response and direct identification of metallic and semiconducting multiwalled carbon nanotubes[J]. PHYSICAL REVIEW B,2003,68(7).
APA Liang, XL.,Peng, LM.,Chen, Q.,Che, RC.,Xia, Y.,...&Wu, QD.(2003).High-field response and direct identification of metallic and semiconducting multiwalled carbon nanotubes.PHYSICAL REVIEW B,68(7).
MLA Liang, XL,et al."High-field response and direct identification of metallic and semiconducting multiwalled carbon nanotubes".PHYSICAL REVIEW B 68.7(2003).
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