Charge modulations in La2CuO4-based cuprates

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	Charge modulations in La2CuO4-based cuprates
	Peng, LM ; Gao, M ; Dong, ZF ; Dong, XL ; Zhao, BR ; Zhao, ZX
刊名	PHYSICAL REVIEW B
	2000
卷号	62 期号:1 页码:189
关键词	HIGH-TEMPERATURE SUPERCONDUCTORS X-RAY ABSORPTION TRANSITION TEMPERATURE ELECTRONIC STATES LA2CUO4+DELTA ANTIFERROMAGNETISM LA2-XSRXCUO4 PHASES OXIDE ORDER
ISSN号	0163-1829
通讯作者	Peng, LM: Chinese Acad Sci, Inst Phys, Beijing Lab Electron Microscopy, POB 2724, Beijing 100080, Peoples R China.
中文摘要	Electron microscopy experiments reveal that in a Cu-rich polycrystalline La2CuO4.003 , grains may phase separate into hole-rich and hole-poor grains at room temperature and in a hole-rich crystalline grain, holes are distributed inhomogeneously over a distance that is smaller than 500 nm. In a hole-rich grain it is shown that hole modulation superlattice reflections may be induced by electron beam, and the size of the modulation domain is estimated to be around 150 nm. The observed modulation superlattice reflections are shown to result from hole localization around a set of parallel modulation planes that are inclined to the CuO2 planes. When intersecting with a CuO2 plane, holes lying on and close to the set of modulation planes form a two-dimensional hole stripe pattern on the CuO2 plane. It is suggested that the observed static hole stripes result from the pinning of fluctuating stripes by electron-beam induced effects. Our results indicate that holes associated with the same modulation plane but different CuO2 planes are strongly correlated and interlayer hole interaction is not in general negligible.
收录类别	SCI
语种	英语
公开日期	2013-09-17
内容类型	期刊论文
源URL	[http://ir.iphy.ac.cn/handle/311004/34684]
专题	物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式 GB/T 7714	Peng, LM,Gao, M,Dong, ZF,et al. Charge modulations in La2CuO4-based cuprates[J]. PHYSICAL REVIEW B,2000,62(1):189.
APA	Peng, LM,Gao, M,Dong, ZF,Dong, XL,Zhao, BR,&Zhao, ZX.(2000).Charge modulations in La2CuO4-based cuprates.PHYSICAL REVIEW B,62(1),189.
MLA	Peng, LM,et al."Charge modulations in La2CuO4-based cuprates".PHYSICAL REVIEW B 62.1(2000):189.