Characterization of heavily Cu-doped La2CuO4+delta by transmission electron microscopy and electron energy loss spectroscopy

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	Characterization of heavily Cu-doped La2CuO4+delta by transmission electron microscopy and electron energy loss spectroscopy
	Gao, M ; Peng, LM ; Dong, XL ; Zhao, BR ; Liu, GD ; Zhao, ZX
刊名	PHYSICAL REVIEW B
	2000
卷号	62 期号:9 页码:5413
关键词	HIGH-TEMPERATURE SUPERCONDUCTORS INTERSTITIAL OXYGEN-ATOMS CHARGE-ORDERED STRIPES PHASE-SEPARATION TRANSITION TEMPERATURE SPIN FLUCTUATIONS LA2-XSRXCUO4 HOLES LA2NIO4+DELTA MODULATION
ISSN号	0163-1829
通讯作者	Gao, M: Chinese Acad Sci, Inst Phys, Electron Microscopy Lab, POB 603, Beijing 100080, Peoples R China.
中文摘要	The techniques of transmission electron microscopy and electron energy loss spectroscopy (EELS) have been used for characterizing heavily Cu-doped polycrystalline La2CuO4.003 (LCO) samples. Semiquantitative and spatially resolved EELS analysis reveals that Cu may be doped into LCO lattice and that Cu doping introduces effectively holes into the sample. At room temperature, the LCO grains were found to phase separate into hole-poor and hole-rich grains, and in hole-rich grains holes were found to have a strong tendency to concentrate and form one-dimensional static ordering with planar domain wall promoted by high-energy electron beam. Two kinds of modulation vectors have been found, they are 1/4b* +/- 1/3c* (with a wavelength similar to 18.9 Angstrom) and 1/6a* +/- 1/3b* +/- 1/2c* (with a wavelength similar to 12.7 Angstrom). At lower temperatures, sharper and higher-order superlattice reflections were observed, indicating an enhanced charge ordering, and superlattice reflections originating from 1/4b* +/- 1/3c* were found to dominate those originating from 1/6a* +/- 1/3b* +/- 1/2c* with a shorter modulation period.
收录类别	SCI
语种	英语
公开日期	2013-09-17
内容类型	期刊论文
源URL	[http://ir.iphy.ac.cn/handle/311004/34636]
专题	物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式 GB/T 7714	Gao, M,Peng, LM,Dong, XL,et al. Characterization of heavily Cu-doped La2CuO4+delta by transmission electron microscopy and electron energy loss spectroscopy[J]. PHYSICAL REVIEW B,2000,62(9):5413.
APA	Gao, M,Peng, LM,Dong, XL,Zhao, BR,Liu, GD,&Zhao, ZX.(2000).Characterization of heavily Cu-doped La2CuO4+delta by transmission electron microscopy and electron energy loss spectroscopy.PHYSICAL REVIEW B,62(9),5413.
MLA	Gao, M,et al."Characterization of heavily Cu-doped La2CuO4+delta by transmission electron microscopy and electron energy loss spectroscopy".PHYSICAL REVIEW B 62.9(2000):5413.