Effective Optical Scattering Range Determination Based on Ray Tracing

doi:10.3390/app13010307

CORC > 长春光学精密机械与物理研究所 > 中国科学院长春光学精密机械与物理研究所

	Effective Optical Scattering Range Determination Based on Ray Tracing
	R. K. Leng; Z. W. Chen; S. Wang; Z. Wang and C. Fang
刊名	Applied Sciences-Basel
	2023
卷号	13 期号:1 页码:12
DOI	10.3390/app13010307
英文摘要	Surface imperfections or contamination on an optical smooth surface is usually inevitable and causes scattering. The directional information of the scattered ray can be related to the spatial frequency through the grating equation. On the other hand, the layout of the optical system determines whether a scattered ray will finally reach the detector according to the positions and directions of the scattered rays. Therefore, the scattering propagation in an optical system is usually band-limited and the effective optical range differs for different systems. In this paper, a method based on ray tracing is described that can statistically determine the optical scattering and the band of roughness. The results can be an essential reference for optical surface polishing and contamination control.
URL标识	查看原文
语种	英语
内容类型	期刊论文
源URL	[http://ir.ciomp.ac.cn/handle/181722/67595]
专题	中国科学院长春光学精密机械与物理研究所
推荐引用方式 GB/T 7714	R. K. Leng,Z. W. Chen,S. Wang,et al. Effective Optical Scattering Range Determination Based on Ray Tracing[J]. Applied Sciences-Basel,2023,13(1):12.
APA	R. K. Leng,Z. W. Chen,S. Wang,&Z. Wang and C. Fang.(2023).Effective Optical Scattering Range Determination Based on Ray Tracing.Applied Sciences-Basel,13(1),12.
MLA	R. K. Leng,et al."Effective Optical Scattering Range Determination Based on Ray Tracing".Applied Sciences-Basel 13.1(2023):12.